Search Results1-20 of  194

  • Heizo Tokutaka ID: 9000347099033

    SOMJapan Inc. (2012 from CiNii)

    Articles in CiNii:1

    • The Classification of the Chain-Link and Layered Random Numbered Planes Data by Spherical SOM (2012)
  • Heizo Tokutaka ID: 9000347099193

    SOMJapan Inc. (2012 from CiNii)

    Articles in CiNii:1

    • The Evaluation for the Cluster Classification of the Liver function data using the Spherical and the Plane SOM (2012)
  • Heizo Tokutaka ID: 9000347099316

    SOMjapan Inc. (2012 from CiNii)

    Articles in CiNii:1

    • The proposal of the judgment method by Self Organizing Maps (SOM) to evade an overestimate and an overlook of the present metabolic syndrome (MS) judgment system (2012)
  • Heizo Tokutaka ID: 9000391548762

    Department of Electrical And Electronic engineering, Tottori University (2001 from CiNii)

    Articles in CiNii:1

    • SOM an approach to Data Mining of Power Transformer Database (2001)
  • Heizo Tokutaka ID: 9000391550159

    Department of Electrical and Electronic Engineering, Tottori University (1999 from CiNii)

    Articles in CiNii:1

    • Performance of Improved SOM-TSP Algorithm for Traveling Salesman Problem of Many Cities (1999)
  • TOKUTAKA HEIZO ID: 9000258400591

    SOM JAPAN Limited Company (2009 from CiNii)

    Articles in CiNii:1

    • The Analysis of the Factory Monitoring System using Self-Organizing Maps (2009)
  • TOKUTAKA HEIZO ID: 9000258400614

    Articles in CiNii:1

    • Performance of Learning Vector quantization based on psude Class (2009)
  • TOKUTAKA HEIZO ID: 9000283837457

    Ltd. SOM JAPAN (2005 from CiNii)

    Articles in CiNii:1

    • Development of checkup system using Self-Organizing Maps (2005)
  • TOKUTAKA Heizo ID: 9000001721658

    Department of Electrical and Electronic Engineering, Tottori University (1995 from CiNii)

    Articles in CiNii:1

    • Optimization of Contact Process with Monte-Carlo Study for Advanced CMOS Devices (1995)
  • TOKUTAKA Heizo ID: 9000003241788

    Central Research Laboratory Matsushita Electric Industrial Co., Ltd. (1965 from CiNii)

    Articles in CiNii:1

    • Magnetic Anisotropy in Single-Crystal Permalloy Thin Films Epitaxially Grown on LiF(110) Surface (1965)
  • TOKUTAKA Heizo ID: 9000004136423

    SOM Japan Inc. (2007 from CiNii)

    Articles in CiNii:11

    • SOM an approach to Data Mining of Power Transformer Database (2001)
    • An Application of the Self-Organizing Map (SOM) to Prediction of Oil Temperature of a Substation Transformer (2002)
    • Use of Chaos and Self-Organizing Maps for Acceleration Plethysmogram Information (2004)
  • TOKUTAKA Heizo ID: 9000020060450

    Tottori Univ. (1988 from CiNii)

    Articles in CiNii:1

    • Report of VAMAS-SCA-WG in Japan. (1988)
  • TOKUTAKA Heizo ID: 9000020061093

    Department of Electronics, Tottori University (1988 from CiNii)

    Articles in CiNii:1

    • Thin film growth of Si or Ge on SiC crystal observed by RHEED. (1988)
  • TOKUTAKA Heizo ID: 9000020062616

    Department of Electronics, Tottori University (1987 from CiNii)

    Articles in CiNii:1

    • Preparation and characterization of magnetron-sputtering Ag-Zn thin film for optical recording. (1987)
  • TOKUTAKA Heizo ID: 9000020062827

    Tottori University (1987 from CiNii)

    Articles in CiNii:1

    • Surface composition analysis of Au-Cu alloy by a micro-auger electron spectroscopy. (1987)
  • TOKUTAKA Heizo ID: 9000020073905

    Department of Electronics, Faculty of Engineering, Tottori University (1981 from CiNii)

    Articles in CiNii:1

    • アブストラクト (1981)
  • TOKUTAKA Heizo ID: 9000020098931

    Dept. of Electrical and Electronic Engineering, Faculty of Engineering, Tottori Univ. (1990 from CiNii)

    Articles in CiNii:1

    • XPS measurements of 7K-phase Bi-Sr-Ca-Cu-O superconducting single crystals. (1990)
  • TOKUTAKA Heizo ID: 9000020107097

    Dept. of Electronics, Faculty of Engineering, Tottori Univ. (1988 from CiNii)

    Articles in CiNii:1

    • Surface composition analysis of Au-Cu alloy by a scanning auger electron microscope. (1988)
  • TOKUTAKA Heizo ID: 9000020110908

    Department of Electronics, Tottori University (1987 from CiNii)

    Articles in CiNii:1

    • Comparison of interfacial reaction between Ti/Si(111) and Ti/SiO2/Si(111) system using AES and DAPS spectroscopies. (1987)
  • TOKUTAKA Heizo ID: 9000020120909

    Department of Electronics, Faculty of Engineering, Tottori University (1984 from CiNii)

    Articles in CiNii:1

    • アブストラクト (1984)
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