Search Results1-20 of  22

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  • Tsukimoto Susumu ID: 9000010046240

    Articles in CiNii:1

    • Growth of GaN on Nitriding TiN Buffer Layers (Special Issue on Narrow and Wide-Bandgap Semiconductor Materials) （2005）
  • TSUKIMOTO Susumu ID: 9000001133577

    World Premier International Research Center, Advanced Institute for Materials Research, Tohoku University （2010 from CiNii）

    Articles in CiNii:9

    • In situ HREM observation of nucleation and growth of nanotwins beneath the solid-liquid interface in Si （2003）
    • The Effect of Strain Distribution on Abnormal Grain Growth in Cu Thin Films （2004）
    • Effect of Organic Additives on Formation and Growth Behavior of Micro-Void in Electroplating Copper Films （2004）
  • TSUKIMOTO Susumu ID: 9000019052315

    WPI Advanced Institute for Materials Research, Tohoku University （2012 from CiNii）

    Articles in CiNii:1

    • High Crystallinity CuScO_2 Delafossite Films Exhibiting Ultraviolet Photoluminescence Grown by Vapor-Liquid-Solid Tri-phase Epitaxy （2012）
  • TSUKIMOTO Susumu ID: 9000020489683

    World Premier International Research Center, Advanced Institute for Materials Research, Tohoku University （2011 from CiNii）

    Articles in CiNii:1

    • Heterointerfaces: atomic structures, electronic states, and related properties （2011）
  • Tsukimoto Susumu ID: 9000023096091

    Articles in CiNii:1

    • Ohmic contacts on silicon carbide: The first monolayer and its electronic effect （2009）
  • Tsukimoto Susumu ID: 9000024726632

    Articles in CiNii:1

    • Effects of TiN Buffer Layer Thickness on GaN Growth （2009）
  • Tsukimoto Susumu ID: 9000024933475

    Articles in CiNii:1

    • Self-formation of Ti-rich interfacial layers in Cu(Ti) alloy films (Special issue: Solid state devices and materials) （2007）
  • Tsukimoto Susumu ID: 9000255901256

    Department of Materials Science and Engineering, Kyoto University （2003 from CiNii）

    Articles in CiNii:1

    • Requirements for Electronic Materials Used in Ultra-high Performance Devices （2003）
  • Tsukimoto Susumu ID: 9000256659815

    Nagoya University （1999 from CiNii）

    Articles in CiNii:1

    • In-situ TEM Observation of Melting and Solidification Processes. （1999）
  • Tsukimoto Susumu ID: 9000257842061

    Department of Materials Science and Engineering, Kyoto University （2004 from CiNii）

    Articles in CiNii:1

    • The Effect of Strain Distribution on Abnormal Grain Growth in Cu Thin Films （2004）
  • Tsukimoto Susumu ID: 9000257842165

    Department of Materials Science and Engineering, Kyoto University （2004 from CiNii）

    Articles in CiNii:1

    • Effect of Organic Additives on Formation and Growth Behavior of Micro-Void in Electroplating Copper Films （2004）
  • Tsukimoto Susumu ID: 9000257844184

    Department of Materials Science and Engineering, Kyoto University （2005 from CiNii）

    Articles in CiNii:1

    • The Effect of Target Purities on Grain Growth in Sputtered Copper Thin Films （2005）
  • Tsukimoto Susumu ID: 9000257844506

    Department of Materials Science and Engineering, Kyoto University （2005 from CiNii）

    Articles in CiNii:1

    • Growth of GaN on Nitriding TiN Buffer Layers （2005）
  • Tsukimoto Susumu ID: 9000257849990

    World Premier International Research Center, Advanced Institute for Materials Research (WPI-AIMR), Tohoku University （2009 from CiNii）

    Articles in CiNii:1

    • Growth and Microstructure of Epitaxial Ti<SUB>3</SUB>SiC<SUB>2</SUB> Contact Layers on SiC （2009）
  • Tsukimoto Susumu ID: 9000297476840

    Articles in CiNii:1

    • Origins of structural and electrochemical influence on Y-doped BaZrO[3] heat-treated with NiO additive （2014）
  • Tsukimoto Susumu ID: 9000391894526

    Tohoku University （2012 from CiNii）

    Articles in CiNii:1

    • Atom-resolved Imaging of Ordered Defect Superstructure at MgO Ʃ5(310)[001] Bicrystal Boundary （2012）
  • Tsukimoto Susumu ID: 9000401571980

    Articles in CiNii:1

    • 2012-01 （2012）
  • Tsukimoto Susumu ID: 9000401793537

    Articles in CiNii:1

    • 2011-01-20 （2011）
  • Tsukimoto Susumu ID: 9000401977059

    Articles in CiNii:1

    • Evaluation of the increase in threading dislocation during the initial stage of physical vapor transport growth of 4H-SiC （2018）
  • Tsukimoto Susumu ID: 9000401977653

    Articles in CiNii:1

    • Reducing warpage of thick 4H-SiC epitaxial layers by grinding the back of the substrate （2019）
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