Search Results1-20 of  27

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  • Tada Munehiro ID: 9000018505758

    Articles in CiNii:1

    • ON-state reliability of solid-electrolyte switch under pulsed alternating current stress for programmable logic device (2011)
  • Tada Munehiro ID: 9000024979715

    Articles in CiNii:1

    • Improved resistive switching characteristics of NiO resistance random-access memory using post-plasma-oxidation process (Special issue: Solid state devices and materials) (2011)
  • Tada Munehiro ID: 9000025030820

    Articles in CiNii:1

    • Porous low-k impacts on performance of advanced LSI devices with GHz operations (Special issue: Solid state devices and materials) (2009)
  • Tada Munehiro ID: 9000403976123

    Articles in CiNii:1

    • Single-Event Effects Induced on Atom Switch-based Field-Programmable Gate Array (2019)
  • TADA Munehiro ID: 9000000080613

    Department of Materials Science, Faculty of Engineering, Tottori Univesity (1999 from CiNii)

    Articles in CiNii:1

    • Orton Rearrangement of N-Chloroacetanilides with the Iron (III)Chloride-Hydrogen Chloride Complex (1999)
  • TADA Munehiro ID: 9000003635885

    Department of Applied Chemistry, Faculty of Science and Technology, Keio University (1998 from CiNii)

    Articles in CiNii:1

    • Sol-Gel Processing of Laf_3 Thin Films (1998)
  • TADA Munehiro ID: 9000004963649

    Green Platform Research Laboratories, NEC Corporation (2015 from CiNii)

    Articles in CiNii:16

    • Application of EB direct writing lithography on manufacturing advanced LSI devices (2003)
    • Low-k Organic Film In-situ surface-modification etching technology for the Cu/Low-k interconncects (2003)
    • A 65nm-node interconnect technology using ultra-thin low-k pore seal (2004)
  • TADA Munehiro ID: 9000020181059

    Department of Materials Science, Faculty of Engineering, Tottori Univesity (1999 from CiNii)

    Articles in CiNii:1

    • Orton Rearrangement of <I>N</I>-Chloroacetanilides with the Iron (III) Chloride-Hydrogen Chloride Complex (1999)
  • TADA Munehiro ID: 9000250473701

    Graduate School of Information Science and Technology, Hokkaido University (2014 from CiNii)

    Articles in CiNii:1

    • An Interactive Editing System for Environmental Light Effects by Feature-Based Interpolation of Intensities (2014)
  • TADA Munehiro ID: 9000404345263

    System Platform Research Laboratories, NEC Corporation (2019 from CiNii)

    Articles in CiNii:1

    • A Cu atom switch fabricated with an advanced CMOS technology (2019)
  • Tada Munehiro ID: 9000006567068

    Osaka Kyoiku Univ. (2007 from CiNii)

    Articles in CiNii:1

    • P-68 Sedimentary facies and in-situ and reworked foraminiferal assemblages of mudstones in the Horinouchi Formation, the Pliocene Kakegawa Group, Shizuoka (2007)
  • Tada Munehiro ID: 9000258410650

    Osaka Kyoiku University (2007 from CiNii)

    Articles in CiNii:1

    • Sedimentary facies and in-situ and reworked foraminiferal assemblages of mudstones in the Horinouchi Formation, the Pliocene Kakegawa Group, Shizuoka (2007)
  • Tada Munehiro ID: 9000401778225

    Articles in CiNii:1

    • Porous Low-kImpacts on Performance of Advanced LSI Devices with GHz Operations (2009)
  • Tada Munehiro ID: 9000401795992

    Articles in CiNii:1

    • Improved Resistive Switching Characteristics of NiO Resistance Random-Access Memory Using Post-Plasma-Oxidation Process (2011)
  • Tada Munehiro ID: 9000401798904

    Articles in CiNii:1

    • ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device (2011)
  • Tada Munehiro ID: 9000401808555

    Articles in CiNii:1

    • Effects of Low-$k$ Stack Structure on Performance of Complementary Metal Oxide Semiconductor Devices and Chip Package Interaction Failure (2012)
  • Tada Munehiro ID: 9000401977604

    Articles in CiNii:1

    • An atom-switch-based field-programmable gate array with optimized driving capability buffer (2019)
  • Tada Munehiro ID: 9000401990383

    Articles in CiNii:1

    • Low-power embedded read-only memory using atom switch and silicon-on-thin-buried-oxide transistor (2015)
  • Tada Munehiro ID: 9000401996867

    Articles in CiNii:1

    • Improved Resistive Switching Characteristics of NiO Resistance Random-Access Memory Using Post-Plasma-Oxidation Process (2011)
  • Tada Munehiro ID: 9000401999773

    Articles in CiNii:1

    • ON-State Reliability of Solid-Electrolyte Switch under Pulsed Alternating Current Stress for Programmable Logic Device (2011)
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