Search Results1-20 of  43

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  • Takato Hidetaka ID: 9000019128827

    Articles in CiNii:1

    • Low-Temperature Back-Surface-Field Structures Applied to Crystalline Silicon Solar Cells : Two-Step Growth with Hydrogen Plasma Treatment for Improving the Reproducibility (Special Issue : Photovoltaic Science and Engineering) (2012)
  • Takato Hidetaka ID: 9000025097652

    Articles in CiNii:1

    • Passivation of germanium surfaces by a quinhydrone-methanol solution treatment (2011)
  • TAKATO Hidetaka ID: 9000004969714

    National Institute of Advanced Industrial Science and Technology(AIST) (2001 from CiNii)

    Articles in CiNii:1

    • Surface Passivation of Silicon Substrates Using Quinhydrone/Methanol Treatment (2001)
  • TAKATO Hidetaka ID: 9000005571201

    National Institute of Advanced Industrial Science and Technology (AIST) (2002 from CiNii)

    Articles in CiNii:3

    • Surface Passivation of Thin Silicon Solar Cells Using Silicon-on-Insulator Wafer (1995)
    • Quinhydrone/Methanol Treatment for the Measurement of Carrier Lifetime in Silicon Substrates (2002)
    • Surface Passivation Effect of Silicon Substrates due to Quinhydrone/Ethanol Treatment (2001)
  • TAKATO Hidetaka ID: 9000016652378

    Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology, AIST Tsukuba Central-2 (2009 from CiNii)

    Articles in CiNii:1

    • Wet Chemical Surface Passivation of Germanium Wafers by Quinhydrone-Methanol Treatment for Minority Carrier Lifetime Measurements (2009)
  • Takato Hidetaka ID: 9000252762457

    Electrotechnical Laboratory (1990 from CiNii)

    Articles in CiNii:1

    • Evaluation of the Si–SiO<SUB>2</SUB> Interface by the Measurement of the Surface Recombination Velocity <I>S</I> by the Dual-Mercury Probe Method (1990)
  • Takato Hidetaka ID: 9000252974296

    Electrotechnical Laboratory (1990 from CiNii)

    Articles in CiNii:1

    • Hydrogen Annealing of Transparent Gate MOS Diodes (1990)
  • Takato Hidetaka ID: 9000252982871

    Electrotechnical Laboratory (1992 from CiNii)

    Articles in CiNii:1

    • Doping Profile Measurement of a Bonded Silicon-on-Insulator Wafer by Capacitance-Voltage Measurements (1992)
  • Takato Hidetaka ID: 9000252982901

    Electrotechnical Laboratory (1992 from CiNii)

    Articles in CiNii:1

    • Effects of Optical Confinement in Textured Antireflection Coating using ZnO Films for Solar Cells (1992)
  • Takato Hidetaka ID: 9000283157028

    Articles in CiNii:1

    • Characteristics of Three-.MU.m-Thick Silicon Solar Cells Using Bonded Silicon-on-Insulator Wafer. (1994)
  • Takato Hidetaka ID: 9000365558339

    National Institute of Advanced Industrial Science and Technology (2017 from CiNii)

    Articles in CiNii:1

    • シリコンインゴットのスライシング加工においてシリコンの結晶方位が切断抵抗に与える影響 (2017)
  • Takato Hidetaka ID: 9000392719837

    Articles in CiNii:1

    • Hydrogen Annealing of Transparent Gate MOS Diodes (1990)
  • Takato Hidetaka ID: 9000392721781

    Articles in CiNii:1

    • Evaluation of the Si–SiO<SUB>2</SUB> Interface by the Measurement of the Surface Recombination Velocity <I>S</I> by the Dual-Mercury Probe Method (1990)
  • Takato Hidetaka ID: 9000392728986

    Articles in CiNii:1

    • Doping Profile Measurement of a Bonded Silicon-on-Insulator Wafer by Capacitance-Voltage Measurements (1992)
  • Takato Hidetaka ID: 9000392732003

    Articles in CiNii:1

    • Effects of Optical Confinement in Textured Antireflection Coating using ZnO Films for Solar Cells (1992)
  • Takato Hidetaka ID: 9000400157911

    Fukushima Renewable Energy Institute (FREA), National Institute of Advanced Industrial Science and Technology (AIST), Japan (2018 from CiNii)

    Articles in CiNii:1

    • DEGRADATION RELATED TO THE INTERCONNECTOR FOR CRYSTALLINE SILICON PV MODULES BY ACCELERATION TESTS (2018)
  • Takato Hidetaka ID: 9000400159078

    National Institute of Advanced Industrial Science Technology, Japan (2018 from CiNii)

    Articles in CiNii:1

    • MICRO-SCALE CHARACTERIZATION OF PERC UNDER THE MANUFACTURING PROCESS BY PHOTO-LUMINESCENCE (2018)
  • Takato Hidetaka ID: 9000401567108

    Articles in CiNii:1

    • 2009-10-02 (2009)
  • Takato Hidetaka ID: 9000401619562

    Articles in CiNii:1

    • Hydrogen Annealing of Transparent Gate MOS Diodes (1990)
  • Takato Hidetaka ID: 9000401619949

    Articles in CiNii:1

    • Evaluation of the Si-SiO2Interface by the Measurement of the Surface Recombination VelocitySby the Dual-Mercury Probe Method (1990)
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