Search Results1-5 of  5

  • TAKEOKA Yoshihiko ID: 9000001028167

    濱田重工(株)シリコンウェハー事業部 (1998 from CiNii)

    Articles in CiNii:1

    • Reclaiming of Silicon Wafer (1998)
  • TAKEOKA Yoshihiko ID: 9000253324137

    R & D Laboratories I. Niooon Steel Corp. (1988 from CiNii)

    Articles in CiNii:1

    • Ring-Likely Distributed Stacking Faults in CZ-Si Wafers (1988)
  • Takeoka Yoshihiko ID: 9000252969858

    R & D Laboratories I, Nippon Steel Corporation (1989 from CiNii)

    Articles in CiNii:1

    • Formation Process of Stacking Faults with Ringlike Distribution in CZ–Si Wafers (1989)
  • Takeoka Yoshihiko ID: 9000392704801

    Articles in CiNii:1

    • Formation Process of Stacking Faults with Ringlike Distribution in CZ–Si Wafers (1989)
  • Takeoka Yoshihiko ID: 9000401614669

    Articles in CiNii:1

    • Formation Process of Stacking Faults with Ringlike Distribution in CZ-Si Wafers (1989)
Page Top