Search Results1-20 of  91

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  • Tamura Hifumi ID: 9000017893714

    Articles in CiNii:1

    • New method of detecting secondary electrons on scanning electron microscope (1968)
  • TAMURA HIFUMI ID: 9000022142491

    Central Research Laboratory, Hitachi Ltd., (1976 from CiNii)

    Articles in CiNii:1

    • Surface Analysis of Insulating Materials by Means of an Ion Microprobe Analyzer (1976)
  • TAMURA HIFUMI ID: 9000022148157

    Articles in CiNii:1

    • A New Analytical Technique for Insulating Materials by Means of an Ion Microanalyzer (1972)
  • TAMURA HIFUMI ID: 9000022148570

    Hitachi Central Research Laboratory (1975 from CiNii)

    Articles in CiNii:1

    • Hollow Cathode Ion Source for IMA (1975)
  • TAMURA HIFUMI ID: 9000022155181

    Central Research Laboratory, Hitachi, Ltd (1977 from CiNii)

    Articles in CiNii:1

    • Application of Characteristic Secondary Ion Mass Spectra to a Depth Analysis of Iron Aluminum Oxide (1977)
  • TAMURA HIFUMI ID: 9000022170889

    Central Research Lab., Hitachi, Ltd. (1975 from CiNii)

    Articles in CiNii:1

    • Qualltitatiue Analysis of Low Alloy Steel with an Ion Microanalyzer (1975)
  • TAMURA HIFUMI ID: 9000022170921

    Central Research Lab., Hitachi Ltd. (1974 from CiNii)

    Articles in CiNii:1

    • Ion Microprobe Analyzer with Wien Filter for Primary Ion Mass Separation (1974)
  • TAMURA HIFUMI ID: 9000022180063

    Central Research Laboratory, Hitachi Ltd., (1976 from CiNii)

    Articles in CiNii:1

    • Surface Analyzer Combining Secondary Ion Mass Spectrometry and Ion Scattering Spectrometry (1976)
  • TAMURA HIFUMI ID: 9000022183297

    Central Research Laboratory, Hitachi Ltd. (1971 from CiNii)

    Articles in CiNii:1

    • An Extracting Method of Secondary Ions in Ion Micro Analyzer (1971)
  • TAMURA HIFUMI ID: 9000258701162

    Takushoku Univ. (2006 from CiNii)

    Articles in CiNii:1

    • Improvement of SIMS depth profiling for microarea analysis by minichip preparation technique (2006)
  • TAMURA Hifumi ID: 9000005527130

    Naka Branch, Central Research Laboratory, Hitachi, Ltd.:(Present address)Central Research Laboratory, Hitachi, Ltd. (1974 from CiNii)

    Articles in CiNii:1

    • Removal of Gas Phase Ions by Energy Selection of Secondary Ions (1974)
  • TAMURA Hifumi ID: 9000005536001

    Hitachi Central Research Laboratory (1965 from CiNii)

    Articles in CiNii:1

    • Measurement of the Lifetime of Minority Carriers in Semiconductors with a Scanning Electron Microscope (1965)
  • TAMURA Hifumi ID: 9000005536140

    Hitachi Central Research Laboratory (1965 from CiNii)

    Articles in CiNii:1

    • Vacuum Evaporator with an Improved Electron Bombardment Heating Unit (1965)
  • TAMURA Hifumi ID: 9000006088239

    Articles in CiNii:9

    • Surface Analysis without Interference of Background Peaks by a Combined SIMS-ESDMS Technique (1995)
    • Improvements of the Accuracy of Depth Profiling in Secondary Ion Mass Spectrometry (SIMS) by using a Mini-Projection Technique (1996)
    • ESDMSの新しい表面分析技術への応用 (1997)
  • TAMURA Hifumi ID: 9000020095729

    Hitachi Central Research Laboratory (1967 from CiNii)

    Articles in CiNii:1

    • The Application of an Electron Beam Evaporator for Shadowing Technique (1967)
  • TAMURA Hifumi ID: 9000020146968

    Central Research Laboratory, Hitachi Ltd. (1974 from CiNii)

    Articles in CiNii:1

    • Ion Microprobe Mass Analyzer Equipped with Specific Devices for Iron and Steel Research (1974)
  • TAMURA Hifumi ID: 9000020147768

    Hitachi Central Research Laboratory (1967 from CiNii)

    Articles in CiNii:1

    • A scanning electron microscope and its application (1967)
  • TAMURA Hifumi ID: 9000020169060

    Central Research Laboratory, Hitachi Ltd (1983 from CiNii)

    Articles in CiNii:1

    • Analysis of Insulating Materials by Negative Ion Microprobe (1983)
  • TAMURA Hifumi ID: 9000020280745

    Central Research Laboratory, Hitachi Ltd (1982 from CiNii)

    Articles in CiNii:1

    • Investigation on Liquid Gallium Ion Source and Scanning Ion Microbeam (1982)
  • TAMURA Hifumi ID: 9000021456365

    Central Research Laboratory, Hitachi Ltd. (1976 from CiNii)

    Articles in CiNii:1

    • Correction of Secondary Ion Intensity by the Total Ion Monitoring Method (1976)
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