Search Results1-13 of  13

  • Tomita Motohiro ID: 9000018898211

    Articles in CiNii:1

    • Evaluation of Anisotropic Strain Relaxation in Strained Silicon-on-Insulator Nanostructure by Oil-Immersion Raman Spectroscopy (Special Issue : Solid State Devices and Materials (1)) (2012)
  • Tomita Motohiro ID: 9000241500723

    Articles in CiNii:1

    • Tensor Evaluation of Anisotropic Stress Relaxation in Mesa-Shaped SiGe Layer on Si Substrate by Electron Back-Scattering Pattern Measurement : Comparison between Raman Measurement and Finite Element Method Simulation (Special Issue : Solid State Devices and Materials) (2013)
  • Tomita Motohiro ID: 9000241500737

    Articles in CiNii:1

    • Measurement of Anisotropic Biaxial Stresses in Si₁₋xGe[x]/Si Mesa Structures by Oil-Immersion Raman Spectroscopy (Special Issue : Solid State Devices and Materials) (2013)
  • TOMITA Motohiro ID: 9000017716655

    Articles in CiNii:5

    • 分子動力学法を用いた2元系Ⅳ-Ⅳ族混晶半導体のフォノン物性の再現と予測 (電子デバイス) (2017)
    • 分子動力学法を用いた2元系Ⅳ-Ⅳ族混晶半導体のフォノン物性の再現と予測 (シリコン材料・デバイス) (2017)
    • Process Evaluation of Si Nanowire for Thermoelectric Device by Raman Spectroscopy (2018)
  • Tomita Motohiro ID: 9000025122210

    Articles in CiNii:1

    • Evaluation of strained-silicon by electron backscattering pattern measurement: comparison study with UV-Raman measurement and edge force model calculation (Selected topics in Applied physics: Technology evolution for silicon nano-electronics) (2011)
  • Tomita Motohiro ID: 9000401793450

    Articles in CiNii:1

    • Evaluation of Strained-Silicon by Electron Backscattering Pattern Measurement: Comparison Study with UV-Raman Measurement and Edge Force Model Calculation (2011)
  • Tomita Motohiro ID: 9000401803635

    Articles in CiNii:1

    • Evaluation of Anisotropic Strain Relaxation in Strained Silicon-on-Insulator Nanostructure by Oil-Immersion Raman Spectroscopy (2012)
  • Tomita Motohiro ID: 9000402004498

    Articles in CiNii:1

    • Evaluation of Anisotropic Strain Relaxation in Strained Silicon-on-Insulator Nanostructure by Oil-Immersion Raman Spectroscopy (2012)
  • Tomita Motohiro ID: 9000402013329

    Articles in CiNii:1

    • Measurement of Anisotropic Biaxial Stresses in Si1-xGex/Si Mesa Structures by Oil-Immersion Raman Spectroscopy (2013)
  • Tomita Motohiro ID: 9000402013333

    Articles in CiNii:1

    • Tensor Evaluation of Anisotropic Stress Relaxation in Mesa-Shaped SiGe Layer on Si Substrate by Electron Back-Scattering Pattern Measurement: Comparison between Raman Measurement and Finite Element Method Simulation (2013)
  • Tomita Motohiro ID: 9000402042955

    Articles in CiNii:1

    • Evaluation of controlled strain in silicon nanowire by UV Raman spectroscopy (2017)
  • Tomita Motohiro ID: 9000402047621

    Articles in CiNii:1

    • 2018-03-08 (2018)
  • Tomita Motohiro ID: 9000402463187

    Articles in CiNii:1

    • Evaluation of thermal conductivity characteristics in Si nanowire covered with oxide by UV Raman spectroscopy (2019)
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