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  • TOMOKAGE HAJIME ID: 9000001301373

    Department of Electronics Engineering and Computer Science, Fukuoka University (2003 from CiNii)

    Articles in CiNii:1

    • Environmentally Benign Formation of Poly(methacrylate ester) Microspheres by Precipitation Copolymerization in Supercritical Carbon Dioxide (2003)
  • TOMOKAGE Hajime ID: 9000001323849

    Articles in CiNii:2

    • Tomokage Laboratory Department of Electronics Engineering and Computer Science Fukuoka University (2004)
    • International Standardization of Device Embedded Substrates (2014)
  • TOMOKAGE Hajime ID: 9000002843643

    Department of Electronics Engineering and Computer Science, Fukuoka University (2012 from CiNii)

    Articles in CiNii:53

    • Characterization of boron-doped homoepitaxial diamond by electron beam-induced current methods (1998)
    • MOU Signing Ceremony between JIEP and IMAPS Korea (2007)
    • Device Simulation of Packaging-Stress Effects of Semiconductor Devices : Evaluation of the Impact of Stress Distribution in the Devices (2011)
  • TOMOKAGE Hajime ID: 9000005548873

    Department of Electronics, Fukuoka University (1999 from CiNii)

    Articles in CiNii:4

    • Schematic Model for the Migration of Interstitialcy-Type Self-Interstitial Including the Middle State (1997)
    • One Bond-Type Migration of Phosphorus in Silicon by Interstitialcy Mechanism (1998)
    • Bulk Boundary Condition for Numerical Solution of Simultaneous Diffusion Equations of Phosphorus and Point Defects in Silicon (1999)
  • TOMOKAGE Hajime ID: 9000005573792

    Department of Electronics Engineering, Fukuoka University (1996 from CiNii)

    Articles in CiNii:1

    • On the Basic Assumption to Obtain Carrier Concentration Profile by Differential Hall Coefficient Measurement (1996)
  • TOMOKAGE Hajime ID: 9000006461421

    Department of Electronics Engineering and Computer Science, Fukuoka University (2002 from CiNii)

    Articles in CiNii:1

    • Field-Emission Activation on Boron-Doped Chemical-Vapor-Deposited Polycrystalline Diamond Films (2002)
  • TOMOKAGE Hajime ID: 9000006616903

    Japan Institute of Electronics Packaging:Fukuoka University (2008 from CiNii)

    Articles in CiNii:1

    • Intention to the Special Edition (2008)
  • TOMOKAGE Hajime ID: 9000014617514

    Department of Electronics Engineering and Computer Science, Faculty of Engineering, Fukuoka University (2012 from CiNii)

    Articles in CiNii:6

    • A new data format for designing device embedded substrates (2011)
    • A new data format for designing device embedded substrates (2011)
    • Design, Evaluation and Analysis Technologies of High-Frequency System-in-a-Package (2006)
  • TOMOKAGE Hajime ID: 9000045472563

    Department of Electronics, Fukuoka University (2000 from CiNii)

    Articles in CiNii:1

    • Effective Diffusion Coefficient and Controlling Process of P Diffusion in Si Based on the Pair Diffusion Models of Vacancy and Interstitial Mechanisms (2000)
  • TOMOKAGE Hajime ID: 9000045942920

    Department of Electronics Engineering, Fukuoka University (1997 from CiNii)

    Articles in CiNii:1

    • Investigation of Grown-in Defect Formation in Czochralski Silicon Crystals by Optical Precipitate Profiler (1997)
  • TOMOKAGE Hajime ID: 9000107339551

    Department of Electronics Engineering and Computer Science, Fukuoka University (2012 from CiNii)

    Articles in CiNii:1

    • Standardization of Data Format for Designing Device Embedded Substrates (2012)
  • TOMOKAGE Hajime ID: 9000259838615

    Department of Electronics Engineering and Computer Science, Fukuoka University (2014 from CiNii)

    Articles in CiNii:1

    • Cu Intercalation under a Zero Layer Graphene Grown on a SiC(0001) Surface (2014)
  • Tomokage Hajime ID: 9000019976750

    Department of Electronics Engineering and Computer Science, Faculty of Engineering, Fukuoka University (2010 from CiNii)

    Articles in CiNii:1

    • Live Together in Asia (2010)
  • Tomokage Hajime ID: 9000020181632

    Department of Electronics Engineering and Computer Science, Fukuoka University (2009 from CiNii)

    Articles in CiNii:1

    • Bandpass Filter Embedded SwP (System with Probe) for High-Frequency Application (2009)
  • Tomokage Hajime ID: 9000020284216

    Department of Electronics Engineering and Computer Science, Fukuoka University (2008 from CiNii)

    Articles in CiNii:1

    • Defect Analysis of High Electron Mobility Transistors Using a Scanning Electron and Laser Beams Induced Current (SELBIC) System (2008)
  • Tomokage Hajime ID: 9000020312301

    Fukuoka University (2008 from CiNii)

    Articles in CiNii:1

    • Welcome to your new journal ! (2008)
  • Tomokage Hajime ID: 9000023179566

    Articles in CiNii:1

    • Experimental Study of Uniaxial-Stress Effects on DC Characteristics of nMOSFETs (2010)
  • Tomokage Hajime ID: 9000024366759

    Articles in CiNii:1

    • Influence of uniaxial mechanical stress on the high frequency performance of metal-oxide-semiconductor field effect transistors on (100) Si wafer (2010)
  • Tomokage Hajime ID: 9000049549119

    Articles in CiNii:1

    • Field Emission Current Uniformity and Stability of Well-Aligned Carbon Nanotubes Synthesized in Methanol (2008)
  • Tomokage Hajime ID: 9000237752079

    Fukuoka University (2012 from CiNii)

    Articles in CiNii:1

    • 26pPSB-29 Initial growth of pentacene films on Si(001)-(2x1) (2012)
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