Search Results1-6 of  6

  • Tsumori Yasuo ID: 9000252973362

    Department of Electrical Engineering, Faculty of Engineering, Kyushu University (1990 from CiNii)

    Articles in CiNii:1

    • Deep Impurity Levels of Cobalt in Silicon (1990)
  • Tsumori Yasuo ID: 9000252983553

    Electronics Research Laboratories, Nippon Steel Corporation (1992 from CiNii)

    Articles in CiNii:1

    • Application of Copper-Decoration Method to Characterize As-Grown Czochralski-Silicon (1992)
  • Tsumori Yasuo ID: 9000392723949

    Articles in CiNii:1

    • Application of Copper-Decoration Method to Characterize As-Grown Czochralski-Silicon (1992)
  • Tsumori Yasuo ID: 9000392728236

    Articles in CiNii:1

    • Deep Impurity Levels of Cobalt in Silicon (1990)
  • Tsumori Yasuo ID: 9000401616454

    Articles in CiNii:1

    • Deep Impurity Levels of Cobalt in Silicon (1990)
  • Tsumori Yasuo ID: 9000401632216

    Articles in CiNii:1

    • Application of Copper-Decoration Method to Characterize As-Grown Czochralski-Silicon (1992)
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