Search Results1-13 of  13

  • Uemura Taiki ID: 9000025030590

    Articles in CiNii:1

    • Robust flip-flop circuit against son errors for combinational and sequential logic circuits (Special issue: Solid state devices and materials) (2009)
  • Uemura Taiki ID: 9000241500307

    Articles in CiNii:1

    • Impact of Parasitic Bipolar Effect on Single-Event Upset in p-Type Metal-Oxide-Semiconductor Field Effect Transistor with Embedded SiGe (Special Issue : Solid State Devices and Materials) (2013)
  • UEMURA Taiki ID: 9000002171339

    Fujitsu Laboratories Ltd. (2007 from CiNii)

    Articles in CiNii:3

    • Neutron-induced Soft-Error Simulation Technology for Logic Circuits (2005)
    • Scaling Trends and Mitigation Techniques for Soft Errors in Flip-Flops (2006)
    • Novel Soft Error Hardened Latches and Flip-Flops (2007)
  • UEMURA Taiki ID: 9000004963835

    Fujitsu Semiconductor Ltd. (2013 from CiNii)

    Articles in CiNii:9

    • The Basic and Mass Production Technique for Flash-MOCVD System of Ferroelectric Thin Film (2003)
    • Comprehensive Study of Soft Errors in Advanced CMOS Circuits with 90/130nm Technology (2005)
    • New Development of Neutron-induced Soft-Error Simulation Technology (2005)
  • UEMURA Taiki ID: 9000323842846

    FUJITSU LABORATORIES LTD. (2015 from CiNii)

    Articles in CiNii:1

    • A Study of Microstructure and Mechanical Properties of Eutectic In-Sn Solder Added Ag (2015)
  • UEMURA Taiki ID: 9000399813086

    FUJITSU LABORATORIES LTD. (2018 from CiNii)

    Articles in CiNii:1

    • Effects of Ag Addition on Solidification Process and Microstructure of InSn Alloy (2018)
  • Uemura Taiki ID: 9000025038687

    Articles in CiNii:1

    • Soft error hardened latch and its estimation method (Special issue: Solid state devices and materials) (2008)
  • Uemura Taiki ID: 9000025097161

    Articles in CiNii:1

    • Neutron-Induced Soft-Error Simulation Technology for Logic Circuits (Special Issue: Solid State Devices & Materials) (2006)
  • Uemura Taiki ID: 9000072141269

    Articles in CiNii:1

    • Technological Trends of Soft Error Estimation Based on Accurate Estimation Method (2006)
  • Uemura Taiki ID: 9000347169795

    Muroran Institute of Technology (2014 from CiNii)

    Articles in CiNii:1

    • Chemical recycling of polyolefins by two-stage catalytic degradation: Effect of first-stage catalyst (2014)
  • Uemura Taiki ID: 9000392118229

    Semiconductor Technology Academic Research Center (2012 from CiNii)

    Articles in CiNii:1

    • Investigation of nuclear data for simulation of cosmic-ray neutron-induced soft errors (2012)
  • Uemura Taiki ID: 9000401778504

    Articles in CiNii:1

    • Robust Flip-Flop Circuit against Soft Errors for Combinational and Sequential Logic Circuits (2009)
  • Uemura Taiki ID: 9000402013500

    Articles in CiNii:1

    • 2013-04-01 (2013)
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