Search Results1-11 of  11

  • YAMADA Kazuji ID: 9000000350350

    Hitachi, Ltd (2000 from CiNii)

    Articles in CiNii:1

    • Vibration Analysis of Encapsulation for High Power Semiconductor Devices (2000)
  • YAMADA Kazuji ID: 9000004974651

    Hitachi Research Labo., Hitachi, Ltd (1995 from CiNii)

    Articles in CiNii:2

    • Temperature Dependence of Nonlinearity on Piezoresistive Pressure Sensor for High Pressure Measurements (1995)
    • RISC・CPU module (1993)
  • YAMADA Kazuji ID: 9000016495654

    Department of Information Engineering, Kagoshima National College of Technology (2010 from CiNii)

    Articles in CiNii:1

    • An Analysis of Stress Induced MOSFET Characteristics Using Piezoresistive Theory (2010)
  • YAMADA Kazuji ID: 9000254279394

    Hitachi Research Laboratory, Hitachi Ltd. (1981 from CiNii)

    Articles in CiNii:1

    • Analysis of the Nonlinear Characteristics of a Semiconductor Pressure Sensor (1981)
  • YAMADA Kazuji ID: 9000254280516

    Hitachi Research Laboratory. Hitachi, Ltd. (1985 from CiNii)

    Articles in CiNii:1

    • Temperature Dependence of Non-Linear Characteristics in Semiconductor Pressure Sensors (1985)
  • YAMADA Kazuji ID: 9000254766182

    Hitachi Research Laboratory, Hitachi Ltd. (1981 from CiNii)

    Articles in CiNii:1

    • Displacement Sensor Using Diffused Type Semiconductor Strain Gages (1981)
  • YAMADA Kazuji ID: 9000254766648

    Hitachi Research Laboratory, Hitachi, Ltd. (1984 from CiNii)

    Articles in CiNii:1

    • Analysis of the Temperature Dependence of a Semiconductor Pressure Sensor (1984)
  • YAMADA Kazuji ID: 9000254769921

    Hitachi Research Labo., Hitachi, Ltd. (1995 from CiNii)

    Articles in CiNii:1

    • Temperature Dependence of Nonlinearity on Piezoresistive Pressure Sensor for High Pressure Measurements (1995)
  • Yamada Kazuji ID: 9000253277740

    Hitachi Research Laboratry, Hitachi, Ltd. (1983 from CiNii)

    Articles in CiNii:1

    • Temperature Dependence of the Piezoresistance Effects of p-Type Silicon Diffused Layers (1983)
  • Yamada Kazuji ID: 9000254051013

    Hitachi Ltd. (1990 from CiNii)

    Articles in CiNii:1

    • Thick film resistors for AlN ceramics and their laser trimming technology. (1990)
  • Yamada Kazuji ID: 9000258454536

    Kagoshima National College of Technology (2006 from CiNii)

    Articles in CiNii:1

    • Stress Dependence of MOS Drain Current on Arbitrary Axis (2006)
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