Search Results1-11 of  11

  • YAMAMOTO YOH ID: 9000397936216

    Articles in CiNii:1

    • The impact of reload after hindlimb suspension of rats (2018)
  • YAMAMOTO Yoh ID: 9000001398396

    R&D Department, SII NanoTechnology, Inc. (2004 from CiNii)

    Articles in CiNii:1

    • A study of the damage on FIB-prepared TEM samples of Al_xGa_<1-x>As (2004)
  • YAMAMOTO Yoh ID: 9000001501047

    Engineering Department R&D Department, SII Nano Technology Inc. (2005 from CiNii)

    Articles in CiNii:1

    • Charge Neutralization Using Focused 500eV Electron Beam in Focused Ion Beam System (2005)
  • YAMAMOTO Yoh ID: 9000004385128

    Tokyo Institute of Technology (2004 from CiNii)

    Articles in CiNii:3

    • Deposition of Nanometer-Sized Materials by Optical Near-Field (1999)
    • Nanometric area deposition by optical near-field. (2000)
    • Parallelization of phylogenetic tree inference using Grid technology (2004)
  • YAMAMOTO Yoh ID: 9000004812619

    Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology (2002 from CiNii)

    Articles in CiNii:4

    • Fabrication of an Ultraviolet Light-Emitting Functional Probe of Sub-Micron Size by Photochemical Vapor Deposition (2000)
    • A Super Low Noise AlInAs/InGaAs HEMT Fabricated by Selective Gate Recess Etching (1995)
    • Lateral Integration of Zn and Al Dots with Nanometer-Scale Precision by Near Field Optical Chemical Vapor Deposition Using a Sharpened Optical Fiber Probe (2002)
  • YAMAMOTO Yoh ID: 9000253327335

    Interdisciplinary graduate school of Science and Engineering, Tokyo Institute of Technology. (2000 from CiNii)

    Articles in CiNii:1

    • Nanometric area deposition by optical near-field (2000)
  • Yamamoto Yoh ID: 9000258148225

    Department of Applied Electronics, Tokyo Institute of Technology, 4259 Nagatsuta–cho, Midori–ku, Yokohama 226–8502, Japan (1999 from CiNii)

    Articles in CiNii:1

    • Vacuum Shear Force Microscopy Application to High Resolution Work. (1999)
  • Yamamoto Yoh ID: 9000258177527

    Engineering Department R&D Department, SII Nano Technology Inc. (2005 from CiNii)

    Articles in CiNii:1

    • Charge Neutralization Using Focused 500 eV Electron Beam in Focused Ion Beam System (2005)
  • Yamamoto Yoh ID: 9000391545039

    Tokyo Institute of Technology (1999 from CiNii)

    Articles in CiNii:1

    • Deposition of Nanometer-Sized Materials by Optical Near-Field (1999)
  • Yamamoto Yoh ID: 9000401686997

    Articles in CiNii:1

    • Vacuum Shear Force Microscopy Application to High Resolution Work (1999)
  • Yamamoto Yoh ID: 9000401744494

    Articles in CiNii:1

    • Charge Neutralization Using Focused 500 eV Electron Beam in Focused Ion Beam System (2005)
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