Search Results1-18 of  18

  • YAMASHITA Kyoji ID: 9000002164961

    ULSI Process Technology Development Center, Semiconductor Company, Matsushita Electronics Corp. (1999 from CiNii)

    Articles in CiNii:1

    • Pocket Profiling of 0.1μm n-MOSFETs Using High Dose Indium Implantation (1999)
  • YAMASHITA Kyoji ID: 9000004825576

    ULSI Process Technology Development Center, Semiconductor Company, Matsushita Electric Ind. Co., Ltd. (2005 from CiNii)

    Articles in CiNii:2

    • A New Test Structure for Precise Location Measurement of Hot-Carrier-Induced Photoemission Peak in Subquarter-Micron MOSFETs (2002)
    • A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission(<Special Section>Microelectronic Test Structures) (2005)
  • YAMASHITA Kyoji ID: 9000004838819

    Semiconductor Technology Academic Research Center (2005 from CiNii)

    Articles in CiNii:5

    • Circuit-Simulation Model of C_<gd> Changes in Small-Size MOSFETs Due to High Channel-Field Gradients (2003)
    • 1/f-Noise Characteristics in 100nm-MOSFETs and Its Modeling for Circuit Simulation (2005)
    • A Compact Model of the Pinch-off Region of 100nm MOSFETs Based on the Surface-Potential(Semiconductor Materials and Devices) (2005)
  • YAMASHITA Kyoji ID: 9000004875142

    ULSI Process Technology Development Center, Matsushita Electronics Corporation (1999 from CiNii)

    Articles in CiNii:1

    • A Design Hierarchy of IC Interconnects and Gate Patterns (1999)
  • YAMASHITA Kyoji ID: 9000005008167

    Toshiba Corporation,Research and Development Center (1995 from CiNii)

    Articles in CiNii:1

    • TRICORN:Photomask defect classification system (1995)
  • YAMASHITA Kyoji ID: 9000005845543

    Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation (2000 from CiNii)

    Articles in CiNii:1

    • Inspection of Critical Dimension and Transmission Uniformity of Contact Patterns by Deep UV Imaging and Regression Algorithm (2000)
  • YAMASHITA Kyoji ID: 9000006463261

    Advanced LSI Technology Laboratory, Corporate Research & Development Center Toshiba Corporation (2002 from CiNii)

    Articles in CiNii:1

    • A New Inspection Method for Phase-Shift Mask (PSM) on Deep-UV Inspection Light Source (2002)
  • YAMASHITA Kyoji ID: 9000021847978

    The 2nd Department of Surgery, School of Medicine, The University of Tokushima, Tokushima, Japan (1988 from CiNii)

    Articles in CiNii:1

    • Comparison of the Binding Nature of Mibolerone to Androgen Receptor of Human Prostate with That of R1881 (1988)
  • YAMASHITA Kyoji ID: 9000254767986

    R & D Center, Toshiba Co. Ltd. (1990 from CiNii)

    Articles in CiNii:1

    • A Method of Setting a Gap by Using Dual Diffraction Gratings (1990)
  • Yamashita Kyoji ID: 9000002914432

    小松島赤十字病院外科 (1988 from CiNii)

    Articles in CiNii:3

    • 示-25 十二指腸静脈瘤破裂の2手術例(<特集>第32回日本消化器外科学会総会) (1988)
    • 12 クロム工場従事者より発見された Occult Lung Cancer の 1 例(Occult lung cancer (II)) (1983)
    • Postoperative Management of Tracheoplasty for Thyroid Carcinoma Involving the Trachea (1984)
  • Yamashita Kyoji ID: 9000258120880

    ULSI Research Laboratory, Research and Development Center, Toshiba Corp., 1 Komukai, Toshiba–cho, Saiwai–ku, Kawasaki 210 (1994 from CiNii)

    Articles in CiNii:1

    • Mask Defect Inspection Method by Database Comparison with 0.25-0.35 .MU.m Sensitivity. (1994)
  • Yamashita Kyoji ID: 9000258149969

    Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation,<BR> 1, Komukai Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan (2000 from CiNii)

    Articles in CiNii:1

    • Inspection of Critical Dimension and Transmission Uniformity of Contact Patterns by Deep UV Imaging and Regression Algorithm. (2000)
  • Yamashita Kyoji ID: 9000258161024

    Semiconductor Technology Academic Research Center, 3-17-2, Shin-Yokohama, Kanagawa 222-0033, Japan (2002 from CiNii)

    Articles in CiNii:1

    • Quantum Effect in Sub-0.1 .MU.m MOSFET with Pocket Technologies and Its Relevance for the On-Current Condition. (2002)
  • Yamashita Kyoji ID: 9000258162595

    Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation, 1 Komukai-toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan (2002 from CiNii)

    Articles in CiNii:1

    • A New Inspection Method for Phase-Shift Mask (PSM) on Deep-UV Inspection Light Source. (2002)
  • Yamashita Kyoji ID: 9000401645064

    Articles in CiNii:1

    • 1994-12-30 (1994)
  • Yamashita Kyoji ID: 9000401693119

    Articles in CiNii:1

    • Inspection of Critical Dimension and Transmission Uniformity of Contact Patterns by Deep UV Imaging and Regression Algorithm (2000)
  • Yamashita Kyoji ID: 9000401705982

    Articles in CiNii:1

    • 2002-04-30 (2002)
  • Yamashita Kyoji ID: 9000401707984

    Articles in CiNii:1

    • A New Inspection Method for Phase-Shift Mask (PSM) on Deep-UV Inspection Light Source (2002)
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