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  • YASUHARA Tohru ID: 9000005104520

    Graduate School of Science and Technology, Ryukoku University (2005 from CiNii)

    Articles in CiNii:1

    • Extraction Technique of Trap Density at Grain boundaries in poly-Si TFTs : Extraction Algorithm using Device Simulator and Extraction Results (2005)
  • YASUHARA Tohru ID: 9000006783330

    Department of Electronics and Informatics, Ryukoku University (2004 from CiNii)

    Articles in CiNii:1

    • Device Simulation of Polycrystalline-Silicon Thin-Film Transistors with Trap States at Front and Back Oxide Interfaces (2004)
  • YASUHARA Tohru ID: 9000107313663

    Department of Electronics and Informatics, Ryukoku University (2007 from CiNii)

    Articles in CiNii:1

    • Extraction Technique of Trap Density at Grain Boundaries in Polycrystalline-Silicon Thin-Film Transistors with Device Simulation (2007)
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