Search Results1-8 of  8

  • YOSHIHARA Takuya ID: 9000017510566

    Graduate School of Science and Engineefing. Waseda University (2009 from CiNii)

    Articles in CiNii:1

    • 6002 A Study on the inter-relationship between Maintenanceof Household and Farmland Usage in Rural Area-Case Study of Okubo, Haramura. Suwa County, Nagano Prefecture (2009)
  • YOSHIHARA Takuya ID: 9000107344258

    System Devices Research Laboratories, NEC Corporation (2005 from CiNii)

    Articles in CiNii:1

    • Fully Silicided NiSi Gate Electrodes on HfSiON Gate Dielectrics for Low-Power Applications (2005)
  • Yoshihara Takuya ID: 9000258180503

    System Devices Research Laboratories, NEC Corporation (2005 from CiNii)

    Articles in CiNii:1

    • Fully Silicided NiSi Gate Electrodes on HfSiON Gate Dielectrics for Low-Power Applications (2005)
  • Yoshihara Takuya ID: 9000258180680

    System Devices Research Laboratories, NEC Corporation (2005 from CiNii)

    Articles in CiNii:1

    • High-Mobility Dual Metal Gate MOS Transistors with High-k Gate Dielectrics (2005)
  • Yoshihara Takuya ID: 9000377394362

    Saga University (2017 from CiNii)

    Articles in CiNii:1

    • Japanese dairy cattle productivity analysis using Bayesian network model (2017)
  • Yoshihara Takuya ID: 9000401656671

    Articles in CiNii:1

    • X-Ray Mask Distortion Induced in Back-Etching Preceding Subtractive Fabrication: Resist and Absorber Stress Effect (1996)
  • Yoshihara Takuya ID: 9000401735587

    Articles in CiNii:1

    • Fully Silicided NiSi Gate Electrodes on HfSiON Gate Dielectrics for Low-Power Applications (2005)
  • Yoshihara Takuya ID: 9000401735593

    Articles in CiNii:1

    • High-Mobility Dual Metal Gate MOS Transistors with High-k Gate Dielectrics (2005)
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