Search Results1-20 of  30

  • 1 / 2
  • YOSHIMURA Nagamitsu ID: 9000000677483

    Articles in CiNii:9

    • Pumping Chracteristics of Sputter Ion Pumps with High Magnetic Fields in an Ultrahigh Vacuum Range (1992)
    • Ar-pumping Characteristics of Diode-type Sputter Ion Pumps with Various Shapes of "Ta/Ti" Cathode-pairs (1992)
    • 電子顕微鏡における超高真空技術 第3章 構成材料のガス放出 (2003)
  • YOSHIMURA Nagamitsu ID: 9000019954897

    JEOL Ltd. (1985 from CiNii)

    Articles in CiNii:1

    • Argon glow conditioning for high voltage electrodes. (1985)
  • YOSHIMURA Nagamitsu ID: 9000019955591

    JEOL Ltd. (1985 from CiNii)

    Articles in CiNii:1

    • Performance comparison between a series diffusion pump system and a single diffusion pump system. (1985)
  • YOSHIMURA Nagamitsu ID: 9000020069479

    JEOL Ltd. (1984 from CiNii)

    Articles in CiNii:1

    • Vacuum Circuit Representing the Function of a High Vacuum System (1984)
  • YOSHIMURA Nagamitsu ID: 9000020071400

    JEOL Ltd. (1982 from CiNii)

    Articles in CiNii:1

    • Specimen Contamination Induced by Fine Electron Probe in Analytical Electron Microscope (1982)
  • YOSHIMURA Nagamitsu ID: 9000020107509

    JEOL Ltd. (1988 from CiNii)

    Articles in CiNii:1

    • アブストラクト (1988)
  • YOSHIMURA Nagamitsu ID: 9000020150388

    JEOL LTD. (1990 from CiNii)

    Articles in CiNii:1

    • Microstructure and elemental features of various stainless steel surfaces. Electro-polished, buff-polished, belt-polished and as-received. (1990)
  • YOSHIMURA Nagamitsu ID: 9000020150442

    Jeol LTD. (1990 from CiNii)

    Articles in CiNii:1

    • Estimation of hydrogen outgassing rate of stainless steel. (1990)
  • YOSHIMURA Nagamitsu ID: 9000020158926

    JEOL Ltd. (1987 from CiNii)

    Articles in CiNii:1

    • アブストラクト (1987)
  • YOSHIMURA Nagamitsu ID: 9000020166479

    JEOL Ltd. (1984 from CiNii)

    Articles in CiNii:1

    • Pumping Speed Measurement for High Vacuum Pumps by Three-point Pressure Measurement in a Conducting Pipe (1984)
  • YOSHIMURA Nagamitsu ID: 9000020169501

    JEOL Ltd. (1982 from CiNii)

    Articles in CiNii:1

    • Application of Resistor Network Simulation Technique to High Vacuum System of Electron Microscope (1982)
  • YOSHIMURA Nagamitsu ID: 9000020170117

    Articles in CiNii:1

    • Advantages of Slow High-Vacuum Pumping for Suppressing Excessive Gas Load in Dynamic Evacuation Systems (2009)
  • YOSHIMURA Nagamitsu ID: 9000020172772

    JEOL Ltd. (1981 from CiNii)

    Articles in CiNii:1

    • Thermal Loss of a Cold Trap (1981)
  • YOSHIMURA Nagamitsu ID: 9000020201354

    日本電子株式会社 (1987 from CiNii)

    Articles in CiNii:1

    • Significance of vacuum technology in electron microscope. (1987)
  • YOSHIMURA Nagamitsu ID: 9000020210152

    JEOL Ltd. (1981 from CiNii)

    Articles in CiNii:1

    • Specimen Contamination Induced by Micro Electron Probe in Analytical Electron Microscope (1981)
  • YOSHIMURA Nagamitsu ID: 9000020228172

    JEOL LTD. (1990 from CiNii)

    Articles in CiNii:1

    • Microstructure and elemental features of vacuum-fired(1050.DEG.C.) stainless steel surface. (1990)
  • YOSHIMURA Nagamitsu ID: 9000020240219

    JEOL Ltd. (1984 from CiNii)

    Articles in CiNii:1

    • Analysis of Pressure Distributions, based on Vacuum Circuits (1984)
  • YOSHIMURA Nagamitsu ID: 9000020242235

    JEOL Ltd. (1982 from CiNii)

    Articles in CiNii:1

    • Resistor Network Simulation Technique for Molecular Flow Vacuum Region (1982)
  • YOSHIMURA Nagamitsu ID: 9000020267984

    JEOL LTD (1989 from CiNii)

    Articles in CiNii:1

    • Measurement of outgassing rates by the pipe method. (1989)
  • YOSHIMURA Nagamitsu ID: 9000020282299

    JEOL Ltd. (1981 from CiNii)

    Articles in CiNii:1

    • On the Vacuum System of Analytical Electron Microscope (1981)
  • 1 / 2
Page Top