Search Results1-5 of  5

  • YOSHITOMI Takashi ID: 9000001923045

    東芝セミコンダクター社 (2001 from CiNii)

    Articles in CiNii:1

    • Development of RF CMOS device (2001)
  • YOSHITOMI Takashi ID: 9000003202157

    Faculty of Engin.Science.Osaka Univ. (1991 from CiNii)

    Articles in CiNii:7

    • 24p-K-10 de Haas-van Alphen effect in YBa_2Cu_3O_7 II (1991)
    • 27p-PS-43 Impurity Effect at Cu(2)site in YBCO_7 (1991)
    • 3p-PS-59 de Haas van Alphen effect in YBa_2Cu_30_7 (1990)
  • YOSHITOMI Takashi ID: 9000004765965

    東芝セミコンダクター社 (2001 from CiNii)

    Articles in CiNii:6

    • Development of RF CMOS device (2001)
    • Process Induced Damage on RFCMOS (1999)
    • Process Induced Damage on RFCMOS (1999)
  • YOSHITOMI Takashi ID: 9000004941461

    Graduate School of Engineering Science, Osaka University (2002 from CiNii)

    Articles in CiNii:1

    • Statistical analysis of relationship between fault detection trend and field quality of software product (2002)
  • YOSHITOMI Takashi ID: 9000006089875

    Articles in CiNii:21

    • Development of Study Support System for Electronic Circuit with Observable V-I Characteristic (2006)
    • Verification of Education Effect on Learning Support System for Electronic Circuit (2007)
    • Design and Implementation of Study Support System for Electronic Circuits with Observable V-I Characteristics (2008)
Page Top