Search Results1-20 of  20

  • Yamaguchi Yutaro ID: 9000241499450

    Articles in CiNii:1

    • Mechanism Study of Gate Leakage Current for AlGaN/GaN High Electron Mobility Transistor Structure Under High Reverse Bias by Thin Surface Barrier Model and Technology Computer Aided Design Simulation (Special Issue : Solid State Devices and Materials) (2013)
  • YAMAGUCHI Yutaro ID: 9000018630679

    Mitsubishi electric corp. Information technology R&D center (2015 from CiNii)

    Articles in CiNii:11

    • III-V quantum well channel MOSFET with back electrode (2011)
    • III-V quantum well channel MOSFET with back electrode (2011)
    • C-10-2 Simulation study of reverse gate leakage current for GaN HEMTs (2012)
  • YAMAGUCHI Yutaro ID: 9000240538723

    the Department of Physical Electronics, Tokyo Institute of Technology (2012 from CiNii)

    Articles in CiNii:1

    • Fabrication of InP/InGaAs SHBT on Si Substrate by Using Transferred Substrate Process (2012)
  • YAMAGUCHI Yutaro ID: 9000242869433

    Information Technology R&D Center, Mitsubishi Electric Corporation, (2013 from CiNii)

    Articles in CiNii:1

    • The study of SSPS GaN amplifier for high-efficiency operation by gate length (2013)
  • YAMAGUCHI Yutaro ID: 9000270280897

    東京大学 (2014 from CiNii)

    Articles in CiNii:1

    • 2-C-7 電力網のサイバー攻撃に対する安全性評価 : ハイパーグラフ最小カット問題の応用(離散最適化(6)) (2014)
  • YAMAGUCHI Yutaro ID: 9000316623421

    Mitsubishi electric corp. Information technology R&D center (2015 from CiNii)

    Articles in CiNii:1

    • Modeling of traps for GaN HEMT by transient response measurement and TCAD simulation (2015)
  • YAMAGUCHI Yutaro ID: 9000404528294

    Information Technology Research and Development Center, Mitsubishi Electric Corporation (2019 from CiNii)

    Articles in CiNii:1

    • GaN Amplifiers of Selectable Output Power Function with Semi-Custom Matching Networks (2019)
  • YAMAMOTO Hiroshi / YAMAGUCHI Shiori / MURAKAMI Yutaro / HOSODA Hiroshi ID: 9000022335695

    Articles in CiNii:1

    • The terpenes from the discolored wood of the Chamaecyparis obtusa by woodwasp (2008)
  • Yamaguchi Yutaro ID: 9000243912061

    University of Tokyo (2015 from CiNii)

    Articles in CiNii:3

    • Packing $A$-paths in Group-Labelled Graphs via Linear Matroid Parity (Optimization : Theory and Application) (2014)
    • Finding a Zero Path in $\mathbb{Z}_3$-Labeled Graphs (Optimization Algorithms : theory, application and implementation) (2015)
    • Finding a Zero Path in $mathbb{Z}_3$-Labeled Graphs (Optimization Algorithms : theory, application and implementation) (2015)
  • Yamaguchi Yutaro ID: 9000280298174

    Mitsubishi Electric Corporation (2014 from CiNii)

    Articles in CiNii:1

    • C-2-7 Prototype of a high breakdown Voltage GaAs Schottky Barrier Diode for a 5.8 GHz-band rectifier (2014)
  • Yamaguchi Yutaro ID: 9000280546438

    Mitsubishi Electric Corporation (2014 from CiNii)

    Articles in CiNii:1

    • C-10-5 Analysis of GaN buffer traps for GaN HEMTs by transient response measurement and TCAD (2014)
  • Yamaguchi Yutaro ID: 9000300663004

    Mitsubishi Electric Corporation (2014 from CiNii)

    Articles in CiNii:1

    • Study of a 5.8GHz-band high efficiency rectifier with a high breakdown voltage GaAs schottky barrier diode (2014)
  • Yamaguchi Yutaro ID: 9000311485617

    Mitsubishi Electric Corporation (2015 from CiNii)

    Articles in CiNii:1

    • C-2-1 Prototype of the 5.8 GHz-band high efficiency rectifier with low resistance and high-voltage GaAs SBD (2015)
  • Yamaguchi Yutaro ID: 9000311485672

    Mitsubishi Electric Corporation (2015 from CiNii)

    Articles in CiNii:1

    • C-2-11 Large signal model for GaN HEMT including an effect of several traps (2015)
  • Yamaguchi Yutaro ID: 9000311485677

    三菱電機株式会社 (2015 from CiNii)

    Articles in CiNii:1

    • C-2-12 Large Signal Modeling of GaN on Si Transistor for Microwave Heating (2015)
  • Yamaguchi Yutaro ID: 9000321422059

    Mitsubishi Electric Corporation (2016 from CiNii)

    Articles in CiNii:1

    • C-10-5 Modeling of GaN-on-Si considering temperature characteristics of carrier in Si substrate (2016)
  • Yamaguchi Yutaro ID: 9000345291169

    Graduate School of Information Science and Technology, Osaka University (2016 from CiNii)

    Articles in CiNii:1

    • Piecewise Sparse Linear Classification via Factorized Asymptotic Bayesian Inference (2016)
  • Yamaguchi Yutaro ID: 9000389945544

    Articles in CiNii:1

    • Combined Loss of JMJD1A and JMJD1B Reveals Critical Roles for H3K9 Demethylation in the Maintenance of Embryonic Stem Cells and Early Embryogenesis (2018)
  • Yamaguchi Yutaro ID: 9000402013852

    Articles in CiNii:1

    • Mechanism Study of Gate Leakage Current for AlGaN/GaN High Electron Mobility Transistor Structure Under High Reverse Bias by Thin Surface Barrier Model and Technology Computer Aided Design Simulation (2013)
  • Yamaguchi Yutaro ID: 9000404516906

    理化学研究所革新知能統合研究センター (2019 from CiNii)

    Articles in CiNii:1

    • General Framework of Stochastic Combinatorial Optimization Problems with Queries (2019)
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