Search Results1-10 of  10

  • YANG Seung-Dong ID: 9000019238110

    Department of Electronics Engineering, Chungnam National University (2012 from CiNii)

    Articles in CiNii:1

    • Comparative Analysis of Bandgap-Engineered Pillar Type Flash Memory with HfO_2 and S_3N_4 as Trapping Layer (2012)
  • YANG Seung-Dong ID: 9000021643670

    Department of Electronics Engineering, Chungnam National University (2012 from CiNii)

    Articles in CiNii:1

    • Comparative Analysis of Bandgap-Engineered Pillar Type Flash Memory with HfO<sub>2</sub> and S<sub>3</sub>N<sub>4</sub> as Trapping Layer (2012)
  • Yang Seung Dong ID: 9000402025688

    Articles in CiNii:1

    • Improvement in n-ZnO/p-Si diode properties using ZnO/AZO homogeneous metal contact (2014)
  • Yang Seung-Dong ID: 9000401809124

    Articles in CiNii:1

    • Electrical Characteristic Analysis of Postannealed ZnO Thin-Film Transistors under O$_{2}$ Ambient (2012)
  • Yang Seung-Dong ID: 9000401809132

    Articles in CiNii:1

    • Electrical Instabilities in Amorphous InGaZnO Thin Film Transistors with Si$_{3}$N$_{4}$ and Si$_{3}$N$_{4}$/Al$_{2}$O$_{3}$ Gate Dielectrics (2012)
  • Yang Seung-Dong ID: 9000402009983

    Articles in CiNii:1

    • Electrical Characteristic Analysis of Postannealed ZnO Thin-Film Transistors under O2Ambient (2012)
  • Yang Seung-Dong ID: 9000402009991

    Articles in CiNii:1

    • Electrical Instabilities in Amorphous InGaZnO Thin Film Transistors with Si3N4and Si3N4/Al2O3Gate Dielectrics (2012)
  • Yang Seung-Dong ID: 9000402013793

    Articles in CiNii:1

    • Investigation of the Gate Bias Stress Instability in ZnO Thin Film Transistors by Low-Frequency Noise Analysis (2013)
  • Yang Seung-Dong ID: 9000402025808

    Articles in CiNii:1

    • Channel engineering of ZnO-based thin film transistors using Al2O3interlayer grown by atomic layer deposition (2014)
  • Yang Seung-dong ID: 9000402021918

    Articles in CiNii:1

    • Analysis of stability improvement in ZnO thin film transistor with dual-gate structure under negative bias stress (2014)
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