Search Results1-16 of  16

  • YUGE Tetsushi ID: 9000004746585

    Articles in CiNii:77

    • Optimization of Life Cycle Cost When a Part of a System is Reused (2005)
    • Connected-(r,s)-out-of-(m,n):Fシステムの漸近寿命分布(鈴木隆教授,五十嵐秀二教授に捧ぐ) (2001)
    • リユースを考慮したシステムのライフサイクルコスト (2003)
  • YUGE Tetsushi ID: 9000004794256

    Department of Electrical and Electronic Engineering, National Defense Academy (2003 from CiNii)

    Articles in CiNii:5

    • Cost Effectiveness of a Man - Machine System Considering Physical Conditions of an Operator (1999)
    • Reliability and Availability of a Repairable Lattice System (2000)
    • MTBF for Consecutive-k-out-of-n: F Systems with Nonidentical Component Availabilities (Special Section on Reliability) (1994)
  • YUGE Tetsushi ID: 9000005793646

    防衛大学校 (2010 from CiNii)

    Articles in CiNii:5

    • Reliability Engineering, Syllabus (2003)
    • NTT霞が関コミュニケーションセンター見学記 (1997)
    • 国際会議報告 : IFORS96 : 第14回国際OR学会連盟国際会議 (1996)
  • YUGE Tetsushi ID: 9000016489642

    Department of Electrical and Electronic Engineering, National Defense Academy (2006 from CiNii)

    Articles in CiNii:1

    • Reliability of a 2-Dimensional Lattice System Subject to Dependent Component Failure (2006)
  • YUGE Tetsushi ID: 9000017689564

    Department of Electrical and Electronic Engineering of National Defense Academy (2009 from CiNii)

    Articles in CiNii:1

    • Availability Analysis of a Two-Echelon Repair Model for Systems Comprising Multiple Items (2009)
  • YUGE Tetsushi ID: 9000240075750

    Department of Electrical and Electronic Engineering, National Defense Academy (2013 from CiNii)

    Articles in CiNii:1

    • Dynamic Fault Tree Analysis for Systems with Nonexponential Failure Components (2013)
  • YUGE Tetsushi ID: 9000263066664

    the Department of Electrical and Electronic Engineering, National Defense Academy (2013 from CiNii)

    Articles in CiNii:1

    • Dynamic Fault Tree Analysis Using Bayesian Networks and Sequence Probabilities (2013)
  • YUGE Tetsushi ID: 9000283636363

    National Defense Academy of Japan (2009 from CiNii)

    Articles in CiNii:1

    • Let's go to IEICE Workshops!:EngiReliability (R) (2009)
  • YUGE Tetsushi ID: 9000290127888

    Department of Electrical and Electronic Engineering of the National Defense Academy (2015 from CiNii)

    Articles in CiNii:1

    • Approximation Method for Obtaining Availability of a Two-Echelon Repair System with Priority Resupply (2015)
  • YUGE Tetsushi ID: 9000307257862

    Department of Electrical and Electronic Engineering of National Defense Academy (2015 from CiNii)

    Articles in CiNii:1

    • Optimal Maintenance Policy of a Multi-Unit One-Shot System with Minimal Repair (2015)
  • YUGE Tetsushi ID: 9000307257866

    National Defense Academy (2015 from CiNii)

    Articles in CiNii:1

    • Availability Analysis of a Multibase System with Lateral Resupply between Bases (2015)
  • YUGE Tetsushi ID: 9000307257926

    Department of Electrical and Electronic Engineering, National Defense Academy (2015 from CiNii)

    Articles in CiNii:1

    • Estimating Failure Probability of a <i>k</i>-out-of-<i>n</i> System Considering Common-Cause Failures (2015)
  • YUGE Tetsushi ID: 9000317157310

    National Defense Academy of Japan (2016 from CiNii)

    Articles in CiNii:1

    • Periodic and Non-Periodic Inspection Policies for a One-Shot System with Minimal Repair (2016)
  • YUGE Tetsushi ID: 9000345335349

    Department of Electrical and Electronic Engineering of National Defense Academy (2017 from CiNii)

    Articles in CiNii:1

    • Maintenance Modeling for a System Equipped on Ship (2017)
  • YUGE Tetsushi ID: 9000378128633

    National Defense Academy (2018 from CiNii)

    Articles in CiNii:1

    • Let's go to IEICE Workshops!:Reliability (R) (2018)
  • YUGE Tetsushi ID: 9000404617364

    防衛大学校 (2018 from CiNii)

    Articles in CiNii:1

    • Optimal Repair Actions Depending on Failure Time for a System with Administrative Delay (2018)
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