宇宙線によるシリコンデバイスの劣化  [in Japanese] Materials Life in Extremely Severe Environments II. Space Radiation Effects on Silicon Devices.  [in Japanese]

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Author(s)

Journal

  • Materials life

    Materials life 9(2), 69-72, 1997-04-30

    MATERIALS LIFE SOCIETY, JAPAN

References:  4

Codes

  • NII Article ID (NAID)
    10002003090
  • NII NACSIS-CAT ID (NCID)
    AN10530609
  • Text Lang
    JPN
  • Article Type
    ART
  • ISSN
    09153594
  • NDL Article ID
    4203422
  • NDL Source Classification
    ZM16(科学技術--科学技術一般--工業材料・材料試験)
  • NDL Call No.
    Z14-1501
  • Data Source
    CJP  NDL  J-STAGE 
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