Formation of a Positive Photoresist Thin Film by Spin Coating. Influence of the Viscosity.

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  • 回転塗布によるポジ型レジスト薄膜形成
  • Formation of a Positive Photoresist Thin Film by Spin Coating
  • Formation of a Positive Photoresist Thi
  • Influence of the Viscosity

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Abstract

Experimental film formation with a positive photoresist solution having various viscosities on wafers by spin coating was investigated. The baked films formed with the lower viscosities are thinner thicknesses at any spinning time due to the higher rates of outflow in the initial stage of the spinning and the higher rates of evaporation in the intermediate stages. Their minimum thickness deviations, which exist in the intermediate stages of the spinning, decrease and change to earlier stages. Those phenomena are more distinct at lower spin speeds.

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