Measurement of Surface Roughness with Small Waviness by Contact Stylus Instrument Correcting Specimen Orientation
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- CHO Nahmgyoo
- Graduate School of Science and Engineering, Tokyo Institute of Technology
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- TSUKADA Tadao
- Faculty of Engineering, Tokyo Institute of Technology
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- TAKAHASHI Masaaki
- Faculty of Engineering, Tokyo Institute of Technology
この論文をさがす
収録刊行物
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- International journal of the Japan Society for Precision Engineering
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International journal of the Japan Society for Precision Engineering 29 (1), 74-79, 1995-03-31
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詳細情報 詳細情報について
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- CRID
- 1574231873798695680
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- NII論文ID
- 10002161253
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- NII書誌ID
- AA1080710X
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- ISSN
- 0916782X
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles