Correction of Specimen Orientation in Three-Dimensional Measurement of Surface Roughness with Small Waviness by Contact Stylus Instrument (1st Report) -Theoretical Foundation-

• CHO Nahmgyoo

  Graduate School of Science and Engineering, Tokyo Institute of Technology

• TSUKADA Tadao

  Faculty Engineering, Tokyo Institute of Technology

• TAKAHASHI Masaaki

  Faculty Engineering, Tokyo Institute of Technology

Journal

• International journal of the Japan Society for Precision Engineering

  International journal of the Japan Society for Precision Engineering 29 (2), 156-161, 1995-06-30

Keywords

• surface roughness
• measurement
• three-dimension
• instrument
• control
• orientation
• profilometer

Details

• CRID: 1571698599008281600
• NII Article ID: 10002161351
• NII Book ID: AA1080710X
• ISSN: 0916782X
• Text Lang: en
• Data Source:
  • CiNii Articles