ＳＰＭを用いた研究の現状と展開　　近接場光学顕微鏡の基本性能とその応用分野

• 斎木 敏治

  神奈川科学技術アカデミー・光極微機能プロジェクト

書誌事項

タイトル別名

• Scanning Probe Microscopy: Present Status and New Development. Basic Performance of Near-Field Optical Microscope and Its Applications.
• キンセツバ コウガク ケンビキョウ ノ キホン セイノウ ト ソノ オウヨウ ブンヤ

抄録

The principles of aperture- and scattering (apertureless)-type near-field optical microscopies (NOM), their related techniques, and their applications are summarized. In terms of a key device of the aperture-type NOM, the functional performance of an optical fiber probe with a small metal aperture is demonstrated through measurement of the photoluminescence image of single quantum dots. In the range of 50-100nm spatial resolution, the aperture-type NOM is an established and reliable technique for the spectroscopy of highly localized structures: spatially resolved spectroscopy of the surface of semiconductor materials or spectroscopic analysis of single particles, such as single molecules, single quantum dots, single metal particles, and so on. The scattering-type NOM, on the other hand, is a promising device to be applied to the surface enhanced spectroscopy, nano-manufacturing, and high density optical memory with higher spatial accuracy and higher efficiency.

収録刊行物

• 表面科学

  表面科学 20 (5), 344-351, 1999

  公益社団法人 日本表面科学会

詳細情報

• CRID: 1390001206456738048
• NII論文ID: 10002267912
• NII書誌ID: AN00334149
• DOI: 10.1380/jsssj.20.344
• ISSN: 18814743
• ISSN: 03885321
• NDL書誌ID: 4720359
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4720359
• Web Site: http://www.jstage.jst.go.jp/article/jsssj1980/20/5/20_5_344/_pdf
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可