書誌事項
- タイトル別名
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- Vacuum-Ultraviolet Light Sources and Their Applications for Processings. Laser-induced Etching of Chlorinated Silicon Surfaces.
- エンソ キュウチャク シリコン ヒョウメン ノ レーザーレイキエッチング
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Measurements of excitation spectra of photoetching of chlorinated Si(111)7×7 surfaces stimulated by ultraviolet nanosecond pulse laser light revealed that there are two distinct spectral peaks, one (α-peak) being located near 290nm and another (β-peak) at 245 nm. The α-peak exhibits a strong supralinear dependence on light intensity above laser fluence of∼100mJ/cm2 pulse, while the β-peak grows linearly with light intensity. The red shift of the α-peak with increasing intensity coincides with the shift of laser abration, which strongly suggests that the origin of the α-peak photoetching is thermal etching enhanced by surface heating due to interband transition in the substrate. The dependence on polarization of the incident light suggests that the β-peak photoetching originates in excitation of hot carriers in the substrate which are captured resonantly by the anti-bonding states of the adsorbate chlorides resulting in destabilization of the molecules.
収録刊行物
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- 表面科学
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表面科学 20 (6), 393-400, 1999
公益社団法人 日本表面科学会
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詳細情報 詳細情報について
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- CRID
- 1390282681432311040
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- NII論文ID
- 10002268107
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- NII書誌ID
- AN00334149
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- ISSN
- 18814743
- 03885321
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- NDL書誌ID
- 4757713
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可