ELECRON ENERGY-LOSS RATES IN GASEOUS Kr AND Xe DETERMINED FROM TRANSIENT MICROWAVE CONDUCTIVITY
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- SUNAGAWA T
- Fukui Institute of Technology
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- KATO H
- Fukui Institute of Technology
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- SHIMAMORI H
- Fukui Institute of Technology
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- TAKAMUKU S
- Fukui Institute of Technology
この論文をさがす
収録刊行物
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- Atomic collision research in Japan
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Atomic collision research in Japan 24 127-129, 1998-11
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詳細情報 詳細情報について
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- CRID
- 1574231873809196544
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- NII論文ID
- 10002402833
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- NII書誌ID
- AA11068271
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles