SOME RESULTS FROM THE TOKYO-EBIT IN 1997-98

  • OHTANI S
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-Comm
  • ASADA J
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • CURRELL F. J
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • FAENOV A. Y
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • FUKAMI T
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • HIRAYAMA T
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • KATO D
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • KINUGAWA T
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • KURAMOTO H
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • MOTOHASHI K
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • NAKAMURA N
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • NOJIKAWA E
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • OKAZAKI K
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • PIKUZ T. A
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • SAKURAI M
    Cold Trapped Ions Project, ICORP, JST, Inst. for Laser Sci., Univ. of Electro-comm
  • SHIMIZU H
    Cold Trapped Ions Project, ICORP, JST, INST. for Laser Sci., Univ. of Electro-comm
  • SOKELL E. J
    Cold Trapped Ions Project, ICORP, JST, INST. for Laser Sci., Univ. of Electro-comm
  • TSURUBUCHI S
    Cold Trapped Ions Project, ICORP, JST, INST. for Laser Sci., Univ. of Electro-comm
  • YAMADA C
    Cold Trapped Ions Project, ICORP, JST, INST. for Laser Sci., Univ. of Electro-comm
  • WATANABE H
    Cold Trapped Ions Project, ICORP, JST, INST. for LAser Sci., Univ. of Electro-comm

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Details 詳細情報について

  • CRID
    1572824498925640320
  • NII Article ID
    10002402863
  • NII Book ID
    AA11068271
  • Text Lang
    en
  • Data Source
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