Possibility of the Discrimination of Different Chemical States by Energy-Dispersive X-Ray Spectroscopy.

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  • XIAO Yanan
    Department of Applied Chemistry, School of Engineering, The University of Tokyo
  • HAYAKAWA Shinjiro
    Department of Applied Chemistry, School of Engineering, The University of Tokyo
  • GOHSHI Yohichi
    Department of Applied Chemistry, School of Engineering, The University of Tokyo
  • OSHIMA Masaharu
    Department of Applied Chemistry, School of Engineering, The University of Tokyo

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タイトル別名
  • Possibility of the Discrimination of Di

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抄録

The chemical shift of the characteristic fluorescence X-ray emission line is far smaller than the resolution of a detector widely used in energy-dispersive spectroscopy, such as a Si(Li) detector. The line position measured with this kind of detector greatly depends on many factors. In the present work, an energy-dispersive X-ray spectroscopy method was introduced to precisely measure the chemical shift of the characteristic X-ray emission line by partitioning the measurement time into many subdivisions with a statistical data-processing procedure. The possibility of this method was also considered theoretically. The chemical state of an element could be identified by using a reference material. The discrimination limit was found to be less than 0.3 eV if electric signal processing could be carefully controlled.

収録刊行物

  • Analytical Sciences

    Analytical Sciences 14 (6), 1139-1144, 1998

    社団法人 日本分析化学会

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