書誌事項
- タイトル別名
-
- Optical Recording Ga-In-oxide Films Prepared by Radio-Frequency Sputtering.
- コウシュウハ スパッタホウ ニ ヨリ サクセイ シタ GaInケイ サンカブツ ヒカリ キロク マク
この論文をさがす
抄録
Thin films of Ga-In oxide (100 nm) have been deposited, at an Ar pressure of 4 Pa, on glass substrate at room temperature by radio-frequency (rf) magnetron sputtering with two targets of Ga2O3 and metallic In, on which rf-power of 150 W and 60 W were added respectively. In the oxide films prepared by this method, the difference in the transmittance, ΔT, between the annealed (300°C × 10 min) and the as-deposited state was more than 60% in the wavelength region of 350600 nm. It was found from XRD spectra that (1) the In (101) peak was formed in the as-deposited state (colored state) and (2) the In2O3 (222) peak was formed in the annealed state (transparent state). The ability to record on these oxide films without protection layer, using THG of Nd : YAG laser (λ=355 nm, 3 ns) was confirmed. These results will be useful for highly sensitive optical recording films with high density in the ultraviolet-blue wavelenght region.
収録刊行物
-
- 真空
-
真空 42 (3), 317-320, 1999
一般社団法人 日本真空学会
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1390001204065379840
-
- NII論文ID
- 10002476525
-
- NII書誌ID
- AN00119871
-
- ISSN
- 18809413
- 05598516
-
- NDL書誌ID
- 4715340
-
- 本文言語コード
- ja
-
- データソース種別
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可