AFM QUANTITATIVE DATA PROVIDES A NEW UNDERSTANDING OF MICRO-ELECTRODISCHARGE MACHINED SURFACES

• ALLEN David M.

  School of Industrial and Manufacturing Science, Cranfield University

• HUANG Sue X.

  School of Industrial and Manufacturing Science, Cranfield University

収録刊行物

• International journal of electrical machining

  International journal of electrical machining 4 7-12, 1999-01-01

キーワード

• Micro-EDM
• surface roughness
• Atomic Force Microscope

詳細情報

• CRID: 1571417124044939264
• NII論文ID: 10002524462
• NII書誌ID: AN10564586
• ISSN: 13417908
• 本文言語コード: en
• データソース種別:
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