Quantitative Analysis of Lattice Strain of Z-Type Faulted Dipole in GaAs

• Shindo Daisuke

  Institute for Advanced Materials Processing, Tohoku Univ.

• Yonenaga Ichiro

  Institute for Materials Research, Tohoku Univ.

• Lim Sung Hwan

  Tohoku Univ.

Bibliographic Information

Other Title

• GaAs中のZ型フォールテッドダイポールの格子歪の定量評価

Journal

• Materia Japan

  Materia Japan 37 (12), 987-987, 1998

  The Japan Institute of Metals and Materials

Keywords

• GaAs
• faulted dipole
• electronic material

Details

• CRID: 1390282679056704000
• NII Article ID: 10002546680
• NII Book ID: AN10433227
• DOI: 10.2320/materia.37.987
• ISSN: 18845843
• ISSN: 13402625
• Web Site: https://www.jstage.jst.go.jp/article/materia1994/37/12/37_12_987/_pdf
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles