Frontiers in Crystallography with Synchrotron Radiation. Utilizing of Various Properties of Synchrotron Radiation. High Precision Lattice Spacing Measurement of GaAs Single Crystals.

• ANDO Masami

  Photon Factory, National Laboratory for High Energy Physics

• YASUAMI Shigeru

  (株) 東芝ULSI研究所

Bibliographic Information

Other Title

• 放射光Ｘ線結晶学で今何ができるか？　微少量・高精度・極限に迫る　ＧａＡｓ単結晶の格子間隔の高精度測定
• GaAs タンケッショウ ノ コウシ カンカク ノ コウ セイド ソクテイ

Abstract

Characterization by high precision lattice spacing measurement using synchrotron radiation is reviewed, Relationship between lattice spaciing and residual strain, dislocation density, composition of raw material and cell structures are given.

Journal

• Nihon Kessho Gakkaishi

  Nihon Kessho Gakkaishi 39 (1), 99-104, 1997

  The Crystallographic Society of Japan

Details

• CRID: 1390001204087415296
• NII Article ID: 10002589351
• NII Book ID: AN00188364
• DOI: 10.5940/jcrsj.39.99
• ISSN: 18845576
• ISSN: 03694585
• NDL BIB ID: 4159576
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4159576
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed