Image reconstruction of a slit flaw using synthetic aperture technique with an angle probe.

• KIMURA Tomonori

  Mitsubishi Electric Corporation

• KAMEYAMA Shumpei

  Mitsubishi Electric Corporation

• WADAKA Shusou

  Mitsubishi Electric Corporation

• MANOME Yuuichi

  Mitsubishi Electric Corporation

• KOIKE Mitsuhiro

  Mitsubishi Electric Corporation

Bibliographic Information

Other Title

• 斜角探触子を用いた開口合成法によるスリット欠陥の像再生

Journal

• 日本音響学会研究発表会講演論文集

  日本音響学会研究発表会講演論文集 1996 (2), 979-980, 1996-09-01

Details

• CRID: 1570572699114459392
• NII Article ID: 10002741620
• NII Book ID: AN00351181
• ISSN: 13403168
• Text Lang: ja
• Data Source:
  • CiNii Articles