Thermal Conductivity Measurement of Liquid Silicon under Microgravity

• NAGATA K.

  Dept. of Chemistry and Materials Science, Tokyo Inst. of Tech.

• YAMASUE E.

  Dept. of Chemistry and Materials Science, Tokyo Inst. of Tech.

• FUKUYAMA H.

  Dept. of Chemistry and Materials Science, Tokyo Inst. of Tech.

• HAYASHI M.

  Dept. of Chemistry and Materials Science, Tokyo Inst. of Tech.

• SUSA M.

  Dept. of Chemistry and Materials Science, Tokyo Inst. of Tech.

Journal

• 材料とプロセス : 日本鉄鋼協会講演論文集 = Current advances in materials and processes : report of the ISIJ meeting

  材料とプロセス : 日本鉄鋼協会講演論文集 = Current advances in materials and processes : report of the ISIJ meeting 12 (4), 857-, 1999-09-01

Details

• CRID: 1570291224124527744
• NII Article ID: 10002765594
• NII Book ID: AN10056461
• ISSN: 09146628
• Text Lang: en
• Data Source:
  • CiNii Articles