The formation mechanisms of paramagnetic defect centers induced by excimer lasers, γ rays, and mechanical fracturing in amorphous SiO₂

• Nishikawa Hiroyuki

  Tokyo Metropolitan University

• Watanabe Eiki

  Tokyo Metropolitan University

• Ito Daisuke

  Tokyo Metropolitan University

• Ohki Yoshimichi

  Waseda University

Bibliographic Information

Other Title

• エキシマレーザ,γ線,および機械的応力による非晶質SiO₂中の常磁性中心の生成機構
• エキシマレーザ,γ線,および機械的応力による非晶質SiO2中の常磁性中心の生成機構
• エキシマ レーザ ガンマセン オヨビ キカイテキ オウリョク ニヨル ヒショウ
• The formation mechanisms of paramagnetic defect centers induced by excimer lasers, γ rays, and mechanical fracturing in amorphous SiO₂

Abstract

The formation mechanisms of paramagnetic defect centers in amorphous SiO₂ induced by excimer lasers, 60Co γ rays, and mechanical fracturing were investigated. Correlation between the paramagnetic defect centers and their precursors introduced during manufacture is discussed for the cases of excimer lasers and γ rays. For the case of mechanical fracturing, formation of strained Si-O-Si bonds as well as paramagnetic defects, is examined. Mechanism of laser or γ ray induced paramagnetic defect centers is compared with that of fracture induced ones.

Journal

• IEEJ Transactions on Fundamentals and Materials

  IEEJ Transactions on Fundamentals and Materials 116 (12), 1129-1137, 1996

  The Institute of Electrical Engineers of Japan

Keywords

• 常磁性中心
• 非晶質SiO₂
• エキシマレーザ
• ⁶⁰Coγ線
• 機械的応力
• 光吸収
• 電子スピン共鳴

Details

• CRID: 1390001204599891840
• NII Article ID: 130006839574
• NII Article ID: 10002820879
• NII Book ID: AN10136312
• DOI: 10.1541/ieejfms1990.116.12_1129
• ISSN: 13475533
• ISSN: 03854205
• NDL BIB ID: 4086745
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4086745
• Web Site: https://www.jstage.jst.go.jp/article/ieejfms1990/116/12/116_12_1129/_pdf
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed