Field Errors and Achievable Precisions with Charge Simulation Method and Surface Charge Simulation Method

• SATO Shuji

  Utsunomiya University

• MURASE Hiroshi

  Toshiba

Bibliographic Information

Other Title

• 電荷重畳法と表面電荷法の電界誤差の原因と到達精度

Journal

• IEEJ Transactions on Fundamentals and Materials

  IEEJ Transactions on Fundamentals and Materials 117 (3), 331-332, 1997

  The Institute of Electrical Engineers of Japan

Keywords

• 表面電荷法
• 電荷重畳法
• 複合誘電体場の電界計算
• 電界誤差
• 誘電率の比が大きな境界

Details

• CRID: 1390001204600579840
• NII Article ID: 10002821524
• NII Book ID: AN10136312
• DOI: 10.1541/ieejfms1990.117.3_331
• ISSN: 13475533
• ISSN: 03854205
• ISSN: http://id.crossref.org/issn/13418939
• Web Site: https://www.jstage.jst.go.jp/article/ieejfms1990/117/3/117_3_331/_pdf
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles