A fundamental study on the shallow resistivity mapping technique using capacitive electrodes
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- HASEGAWA Nobusuke
- OYO corporation
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- SHIMA Hiromasa
- OYO corporation
Bibliographic Information
- Other Title
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- キャパシタ電極を用いた浅部比抵抗マッピング法実用化のための基礎研究
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Journal
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- 物理探査学会学術講演会講演論文集 = Proceeding of the SEGJ Conference
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物理探査学会学術講演会講演論文集 = Proceeding of the SEGJ Conference 92 414-417, 1995-06
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Details 詳細情報について
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- CRID
- 1571980073987575808
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- NII Article ID
- 10002837152
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- NII Book ID
- AN10532932
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- Text Lang
- ja
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- Data Source
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- CiNii Articles