Concentration index for analyzing three dimensional line patterns and its application to X-ray CT images

• MEKADA Y.

収録刊行物

• Trans. of IEICE

  Trans. of IEICE 80 1162-1170, 1997

詳細情報

• CRID: 1572824498983728896
• NII論文ID: 10003529587
• NII書誌ID: AA10684666
• データソース種別:
  • CiNii Articles