Analysis of disappearance and migration at the bond interface during liquid phase diffusion bonding

  • ENDO Kyosuke
    Department of Materials Science and engineering, Muroran Institute of Tecnology
  • 田湯 善章
    Department of Materials Science and engineering, Muroran Institute of Tecnology
  • 桃野 正
    Department of Materials Science and engineering, Muroran Institute of Tecnology
  • 片山 博
    Department of Materials Science and engineering, Muroran Institute of Tecnology

Bibliographic Information

Other Title
  • 液相拡散接合における接合界面の消失・移動現象の解析

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Details 詳細情報について

  • CRID
    1570572699160864256
  • NII Article ID
    10003797926
  • NII Book ID
    AN10056461
  • ISSN
    09146628
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

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