書誌事項
- タイトル別名
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- D.C. electrical potential technique for monitoring crack growth in CT speciments at elevated temperatures.
- チョクリュウ デンキ ポテンシャルホウ ニ ヨル CT シケンヘン ノ コウオ
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抄録
D.C. electrical potential technique has been successfully used to monitor crack extension in CT specimens at elevated temperatures. An electrical potential measurement system with various features was constructed. A simple graphite paper method was used to obtain the calibration curve for crack length ratio (a/W) vs. normalized electrical potential (Va/Va0). Polynomial equations (1) (2) were proposed for electrical potential calibration of CT specimens. These equations agreed well with elastic fatigue crack growth, elastic-plastic fatigue crack growth as well as creep crack growth test results for carbon steel, low alloy steel and austenitic stainless steel in the range of RT to 650°C. A convenient procedure to convert electrical potential into crack length was also proposed as shown in Fig. 6. These proposed calibration curve and conversion procedure are useful for standardization of electrical potential technique in future.
収録刊行物
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- 材料
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材料 35 (390), 312-316, 1986
公益社団法人 日本材料学会
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詳細情報 詳細情報について
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- CRID
- 1390282680368955520
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- NII論文ID
- 110002296766
- 10003924104
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- NII書誌ID
- AN00096175
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- ISSN
- 18807488
- 05145163
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- NDL書誌ID
- 3070367
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可