Structure and Sensing Properties of NO<sub>2</sub> Gas in Copper Phthalocyanine Langmuir-Blodgett Film Devices
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- Shinbo Kazunari
- Nugata University
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- Takeishi Tsuyoshi
- Nugata University
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- Kondo Yusuke
- Nugata University
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- Kato Keizo
- Nugata University
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- Kaneko Futao
- Nugata University
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- Kobayashi Satoshi
- Nugata University
Bibliographic Information
- Other Title
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- 銅フタロシアニンLB膜素子の構造とNO<sub>2</sub>ガス電流応答特性
- 銅フタロシアニンLB膜素子の構造とNO2ガス電流応答特性
- ドウ フタロシアニン LBマク ソシ ノ コウゾウ ト NO2 ガス デンリュ
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Abstract
Copper phthalocyanine (CuPc) LB film devices were fabricated and the sensing properties of NO2 gas were investigated. The CuPc LB films were deposited onto glass substrates or the glasses covered with three monolayers of cadmium arachidate LB films by the vertical dipping method. Two xylene solutions containing 0.1mM and 0.5mM CuPc were used as the spreading solution. The -A isotherms indicated the area per CuPc molecule at the water surface was small in the case using 0.5mM solution. which suggests the formation of bi-monolayer. The excellent depositions were carried out in the case using the glass substrates covered with the cadmium arachidate LB monolayers. The I-V characteristics of CuPc LB devices showed the hopping conduction in the LB films. The currents increased with time by the change of the atmosphere gas from N2 to NO2 and vice versa. The response spectra strongly dependent on the concentration of the spreading solution and the substrate. Especially, the responses with two steps were observed in the devices deposited on the glass substrates with the high concentration solution. The responses were tentatively estimated to be due to the adsorption of the NO2 gas molecules on the LB films and the diffusion of NO2 gas molecules into the LB films. The diffusion was thought to depend on the thickness and/or disorder of the LB films, and the atomic force microscopy measurement supported the results. These results are greatly useful for development of NO2 gas sensors.
Journal
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- IEEJ Transactions on Fundamentals and Materials
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IEEJ Transactions on Fundamentals and Materials 118 (12), 1405-1411, 1998
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390282679575032576
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- NII Article ID
- 10004441358
- 130006838263
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- NII Book ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL BIB ID
- 4612126
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed