A Novel Nondestructive Inspection and Monitoring technique for Plant life management-Induced Current Focusing Potential Drop Technique

• SHOJI T.

収録刊行物

• Proceedings of International Symposium on Plant Aging and Life Predictions of Corrodible Structures

  Proceedings of International Symposium on Plant Aging and Life Predictions of Corrodible Structures 371-377, 1997

詳細情報

• CRID: 1570572699250745728
• NII論文ID: 10004471574
• データソース種別:
  • CiNii Articles