Analysis of chromosome aberration after Neon ion beam irradiation by Atomic Force Microscope (AFM)

Bibliographic Information

Other Title
  • ネオンイオン線照射による染色体異常の原子間力顕微鏡による解析

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Details 詳細情報について

  • CRID
    1571980074139377152
  • NII Article ID
    10004491804
  • NII Book ID
    AN10164806
  • ISSN
    09149201
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

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