Atomic Force Spectroscopy and Control using Atomic Force Microscope

• MORITA S.

  Dept.of Electronic Eng., Osaka Univ.

• SUGAWARA Y.

  Dept.of Electronic Eng., Osaka Univ.

Bibliographic Information

Other Title

• AFMによる原子間力の分光と制御

Journal

• 電子顕微鏡

  電子顕微鏡 34 15-, 1999-05-01

Details

• CRID: 1574231873995951232
• NII Article ID: 10004538676
• NII Book ID: AN00145000
• ISSN: 04170326
• Text Lang: ja
• Data Source:
  • CiNii Articles