Development of a Novel Sample Preparation Method using an FIB Apparatus for EDX Analyses in Large-Area High Resolution Electron Microscopy

• SUEMATSU H.

  Materials and Structures Lab., Tokyo Inst.Tech.

• OKAMURA H.

  Materials and Structures Lab., Tokyo Inst.Tech.

• YAMAUCHI H.

  Materials and Structures Lab., Tokyo Inst.Tech.

• UDO K.

  School of Dentistry, Nagasaki Univ.

• TANAKA Y.

  School of Dentistry, Nagasaki Univ.

• HISATSUNE K.

  School of Dentistry, Nagasaki Univ.

Bibliographic Information

Other Title

• FIBを用いたEDX分析可能な広範囲高分解能電子顕微鏡(LA-HREM)用試料作製法の開発

Journal

• 電子顕微鏡

  電子顕微鏡 34 78-, 1999-05-01

Details

• CRID: 1571417124228863872
• NII Article ID: 10004538811
• NII Book ID: AN00145000
• ISSN: 04170326
• Text Lang: ja
• Data Source:
  • CiNii Articles