Examination of high-frequency limit of a semiconductor BSE detector and its image quality improvement using digital image processing techniques

• OHSHIMA Y.

  Kougakuin Univ.

• OHO E.

  Kougakuin Univ.

• KAWAMATA S.

  Hitachi Science Systems, Co., Ltd.

Bibliographic Information

Other Title

• ディジタル画像処理技術を用いた半導体BSE検出器の高域制限の検討と画質改善

Journal

• 電子顕微鏡

  電子顕微鏡 34 254-, 1999-05-01

Details

• CRID: 1571980074181913216
• NII Article ID: 10004539230
• NII Book ID: AN00145000
• ISSN: 04170326
• Text Lang: ja
• Data Source:
  • CiNii Articles