Development of a Simulator for Cell-projection Type Electron Beam Lithography.
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- KOTERA Masatoshi
- Department of Electronic Engineering, Osaka Institute of Technology
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- YAMAGUCHI Kiyoshi
- Department of Electronic Engineering, Osaka Institute of Technology
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- MATSUOKA Koji
- Electron Beam Direct Writing Group, Semiconductor Leading Edge Technologies
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- OKAGAWA Takashi
- Electron Beam Direct Writing Group, Semiconductor Leading Edge Technologies
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- KOJIMA Yoshinori
- Electron Beam Direct Writing Group, Semiconductor Leading Edge Technologies
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- YAMABE Masaki
- Electron Beam Direct Writing Group, Semiconductor Leading Edge Technologies
Bibliographic Information
- Other Title
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- 部分一括露光方式電子ビームリソグラフィ用シミュレータの開発
- ブブン イッカツ ロコウ ホウシキ デンシ ビームリソグラフィヨウ シミュレータ ノ カイハツ
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Abstract
We developed a Monte Carlo simulation of electron trajectories in a cell-projection electron beam lithography optical system. In the simulation the emission angle, the velocity and the emission timing of electrons from the electron gun are taking into account. The Coulomb interaction among electrons in the beam is calculated. There are five lenses in the system. Assuming that the stencil mask pattern is a series of line-and-space, the exposure pattern is obtained when the current densities are 5, 10, and 13 A/cm2 at the specimen surface. The probability of electrons to enter the designed pattern as a function of the defocusing distance are calculated. The best refocus length is obtained to give the maximum probability in the designed pattern at the specimen surface.
Journal
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- Shinku
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Shinku 42 (8), 764-767, 1999
The Vacuum Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390001204063810816
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- NII Article ID
- 10004568346
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- NII Book ID
- AN00119871
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- ISSN
- 18809413
- 05598516
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- NDL BIB ID
- 4850483
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed