Stable operation mode for dynamic noncontact atomic force microscopy

• H. Ueyama

• Y. Sugawara

• S. Morita

収録刊行物

• Applied Physics A: Materials Science & Processing

  Applied Physics A: Materials Science & Processing 66 (7), S295-S297, 1998-03-01

  Springer Science and Business Media LLC

キーワード

• General Materials Science
• General Chemistry

詳細情報

• CRID: 1363388844142999680
• NII論文ID: 10004630429
• DOI: 10.1007/s003390051149
• ISSN: 14320630
• ISSN: 09478396
• Web Site: http://link.springer.com/content/pdf/10.1007/s003390051149.pdf
• Web Site: http://link.springer.com/article/10.1007/s003390051149/fulltext.html
• Web Site: http://link.springer.com/content/pdf/10.1007/s003390051149
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  • CiNii Articles