The Past and Future of Electron Microscopy and Electron Diffraction

• TANAKA Michiyoshi

  Research Institute for Scientific Measurements, Tohoku University

Bibliographic Information

Other Title

• 電子顕微鏡・電子回折の拓く道
• デンシ ケンビキョウ デンシ カイセツ ノ ヒラク ミチ

Journal

• Nihon Kessho Gakkaishi

  Nihon Kessho Gakkaishi 42 (3), 264-268, 2000

  The Crystallographic Society of Japan

Details

• CRID: 1390001204087913600
• NII Article ID: 10004673533
• NII Book ID: AN00188364
• DOI: 10.5940/jcrsj.42.264
• ISSN: 18845576
• ISSN: 03694585
• NDL BIB ID: 5391752
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I5391752
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles